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Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.
Electron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Emission
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Physics --- Electron spectroscopy --- Spectroscopie électronique --- Periodicals --- Périodiques --- Electron spectroscopy. --- Spectroscopie électronique --- Périodiques. --- Chemistry --- Electrochemistry --- Electronics --- Engineering --- General and Others --- Chemistry. --- Electronics. --- Engineering.
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X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and
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Handbook of Mineral Spectroscopy, Volume Two: Infrared Spectra, a Four Volume Set presents a database of Infrared spectra, showing both full spectra and high-resolution spectral regions with band component analyses of rock-forming and major ore minerals. IR of minerals is a very powerful technique for analyzing the different vibrational modes of minerals (in particular functional groups) but also the local environment of atoms in a crystal structure. The book includes a section on silicates and one on non-silicates, subdivided according to the normal mineral classes.
Photoelectron spectroscopy. --- Spectroscopy, Photoelectron --- Electron spectroscopy --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Photoelectricity --- Spectrum analysis --- Infrared spectroscopy. --- Mineralogy --- Analysis.
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Electronic and photoelectron spectroscopy can provide extraordinarily detailed information on the properties of molecules and are in widespread use in the physical and chemical sciences. Applications extend beyond spectroscopy into important areas such as chemical dynamics, kinetics and atmospheric chemistry. This book aims to provide the reader with a firm grounding of the basic principles and experimental techniques employed. The extensive use of case studies effectively illustrates how spectra are assigned and how information can be extracted, communicating the matter in a compelling and instructive manner. Topics covered include laser-induced fluorescence, resonance-enhanced multiphoton ionization, cavity ringdown and ZEKE spectroscopy. The volume is for advanced undergraduate and graduate students taking courses in spectroscopy and will also be useful to anyone encountering electronic and/or photoelectron spectroscopy during their research.
Photoelectron spectroscopy --- Electron spectroscopy --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Spectroscopy, Photoelectron --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Photoelectricity --- Spectrum analysis --- Study and teaching. --- Emission --- Study and teaching --- Photoelectron spectroscopy - Study and teaching --- Electron spectroscopy - Study and teaching
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Photoelectron spectroscopy. --- X-ray spectroscopy. --- Electron spectroscopy. --- 543.422.27 --- Electron spectroscopy --- Photoelectron spectroscopy --- X-ray spectroscopy --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- Spectrum analysis --- Spectroscopy, Photoelectron --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Photoelectricity --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- Emission --- 543.422.27 Using ultra-high frequency electromagnetic waves (microwaves). Electron spin resonance spectroscopy --- XES (X-ray emission spectroscopy)
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543.428.6 --- 544.171.42 --- Photoelectron spectroscopy --- #WSCH:MACC --- #WSCH:AAS1 --- #WSCH:AAS2 --- Spectroscopy, Photoelectron --- Electron spectroscopy --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Photoelectricity --- Spectrum analysis --- Photolelectron spectra
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The second edition of Internal Photoemission Spectroscopy thoroughly updates this vital, practical guide to internal photoemission (IPE) phenomena and measurements. The book's discussion of fundamental physical and technical aspects of IPE spectroscopic applications is supplemented by an extended overview of recent experimental results in swiftly advancing research fields. These include the development of insulating materials for advanced SiMOS technology, metal gate materials, development of heterostructures based on high-mobility semiconductors, and more. Recent results concerning
Photoelectron spectroscopy. --- Photoemission. --- Semiconductors -- Junctions. --- Photoelectron spectroscopy --- Photoemission --- Semiconductors --- Chemistry --- Physics --- Physical Sciences & Mathematics --- Analytical Chemistry --- Light & Optics --- Junctions --- Junctions. --- Emission, Photoelectric --- External photoelectric effect --- Photoelectric effect, External --- Photoelectric emission --- Electrons --- Photoelectricity --- Junctions, Semiconductor --- Semiconductor interface --- Semiconductor interfaces --- Semiconductor junctions --- Interfaces (Physical sciences) --- Spectroscopy, Photoelectron --- Electron spectroscopy --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Spectrum analysis --- Emission --- Interfaces
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Written by the Shale Shaker Committee of the American Society of Mechanical Engineers, originally of the American Association of Drilling Engineers, the authors of this book are some of the most well-respected names in the world for drilling. The first edition, Shale Shakers and Drilling Fluid Systems, was only on shale shakers, a very important piece of machinery on a drilling rig that removes drill cuttings. The original book has been much expanded to include many other aspects of drilling solids control, including chapters on drilling fluids, cut-point curves, mud cleaners, and many other
Electronics. --- Electron energy loss spectroscopy. --- EELS (Spectrum analysis) --- Energy loss spectroscopy, Electron --- Spectroscopy, Electron energy loss --- Drilling muds --- Shale shakers --- Electron spectroscopy --- Electrical engineering --- Physical sciences --- Mud screens --- Shakers, Shale --- Vibrating screens --- Oil well drilling --- Separators (Machines) --- Drilling fluids --- Fluids, Drilling --- Mud-laden fluids --- Muds, Drilling --- Oil well drilling fluids --- Oil well drilling muds --- Petroleum --- Boring --- Excavation --- Oil field chemicals --- Soil stabilization --- Equipment and supplies
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