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This book presents a comprehensive review of accelerometers focusing on the basic operation principles, structure and applications. The review covers accelerometers research studies performed by authors across the globe in the last decade, including recent research in the development of new accelerometers and their applications in several areas, such as civil engineering and health sciences. This edited book includes state-of-the-art accelerometers research and technologies for relevant applications. It is organized in eleven chapters describing leading-edge research in a cross-section of fiel
Accelerometers. --- Aeronautical instruments --- Speed-indicators
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This book provides an invaluable reference to Piezoelectric Accelerometers with Integral Electronics (IEPE). It describes the design and performance parameters of IEPE accelerometers and their key elements, PE transducers and FET-input amplifiers. Coverage includes recently designed, low-noise and high temperature IEPE accelerometers. Readers will benefit from the detailed noise analysis of the IEPE accelerometer, which enables estimation of its noise floor and noise limits. Other topics useful for designers of low-noise, high temperature silicon-based electronics include noise analysis of FET amplifiers, experimental investigation and comparison of low-frequency noise in different JFETs and MOSFETs, and ultra-low-noise JFETs (at level of 0.6 nV/√Hz). The discussion also includes ultra-low-noise (at level of 3 ng/√Hz) seismic IEPE accelerometers and high temperature (up to 175 ̊C) triaxial and single axis miniature IEPE accelerometers, along with key factors for their design. • Provides a comprehensive reference to the design and performance of IEPE accelerometers, including low-noise and high temperature IEPE sensors; • Includes noise analysis of the IEPE accelerometer, which enables estimation of the its noise floor and noise limits; • Describes recently design of ultra-low-noise (at level of 3 ng/√Hz) IEPE seismic accelerometers and high temperature (up to 175 ̊C) triaxial and single axis miniature IEPE accelerometers; • Compares low-frequency noise in different JFETs and MOSFETs including measurement results of ultra-low-noise (at level of 0.6 nV/√Hz) JFET; • Presents key factors for design of low-noise and high temperature IEPE accelerometer and their electronics.
Engineering. --- Electronics and Microelectronics, Instrumentation. --- Circuits and Systems. --- Mechanical Engineering. --- Mechanical engineering. --- Electronics. --- Systems engineering. --- Ingénierie --- Génie mécanique --- Electronique --- Ingénierie des systèmes --- Manufacturing processes. --- Piezoelectric devices. --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Accelerometers. --- Piezoelectricity. --- Piezo-electricity --- Piezoelectric effect --- Pyro- and piezo-electricity --- Microelectronics. --- Electronic circuits. --- Electrical engineering --- Physical sciences --- Crystallography --- Electricity --- Pyroelectricity --- Aeronautical instruments --- Speed-indicators --- Engineering, Mechanical --- Engineering --- Machinery --- Steam engineering --- Engineering systems --- System engineering --- Industrial engineering --- System analysis --- Design and construction --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Microminiature electronic equipment --- Microminiaturization (Electronics) --- Microtechnology --- Semiconductors --- Miniature electronic equipment
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