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This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach.

Optical physics --- Mensuration & systems of measurement --- surface metrology --- profilometry --- interferometry --- low-coherence interferometry --- semiconductor manufacturing --- optical metrology --- Open Access

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Mensuration --- Weights and measures --- Measurement --- Measurement. --- Weights and measures. --- Measures --- Physics --- Metrology --- Units of measurement --- Weight (Physics) --- Measuring --- Mathematics --- Technology --- Physical measurements

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The validation of analytical methods is based on the characterisation of a measurement procedure (selectivity, sensitivity, repeatability, reproducibility). This volume collects 31 outstanding papers on the topic, mostly published in the period 2000-2003 in the journal ""Accreditation and Quality Assurance"". They provide the latest understanding, and possibly the rationale why it is important to integrate the concept of validation into the standard procedures of every analytical laboratory. In addition, this anthology considers the benefits to both: the analytical laboratory and the user of t

Chemistry, Analytic --- Measurement. --- Chemical laboratories --- Quality control. --- Accreditation. --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Analytical biochemistry. --- Analytical Chemistry. --- Analytic biochemistry --- Biochemistry --- Bioanalytic chemistry --- Bioanalytical chemistry --- Analytical chemistry --- Analytical chemistry. --- Analysis, Chemical --- Analytic chemistry --- Chemical analysis --- Chemistry

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Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.

Scanning electron microscopy. --- Nanotechnology. --- Molecular technology --- Nanoscale technology --- High technology --- Electron microscopy --- Surfaces (Physics). --- Optical materials. --- Characterization and Evaluation of Materials. --- Optical and Electronic Materials. --- Measurement Science and Instrumentation. --- Optics --- Materials --- Physics --- Surface chemistry --- Surfaces (Technology) --- Materials science. --- Electronic materials. --- Physical measurements. --- Measurement   . --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Electronic materials --- Material science --- Physical sciences

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This open-access book addresses the following questions: how does the polarization of a particle, i.e., the angular momentum state in which it is produced, manifest itself in nature? What are the concepts and tools needed to perform rigorous measurements providing complete and unambiguous physical information? Polarization measurements are important because they reflect the nature and coupling properties of a particle and provide unique insights into the underlying fundamental interactions, playing a central role in the study and understanding of the mechanisms of particle production. Besides gradually reviewing many fundamental notions, the book presents several case studies relevant to physics analyses underway at the LHC, including the lepton-antilepton decays of vector states (Drell–Yan, Z and W bosons, quarkonia, etc.). The book also offers a detailed discussion of cascade decays, where the vector particle is a daughter of another particle, as well as a survey of typical angular distributions of particles of any integer or half-integer spin. With a visual approach to the presentation of the concepts and frequent use of pedagogical examples, taken from real measurements, gedankenexperiments, or detailed simulations, the book focuses on aspects of polarization measurements that are sometimes underestimated or left unexplored in experimental analyses, such as the importance of the choice of the reference frame, the existence of frame-independent relations, and the shapes of the physically allowed parameter domains. Several examples are provided of pitfalls introduced when the intrinsic multidimensionality of the problem is neglected in exchange for a simplified analysis. Targeting an audience of graduate students, post-docs, and other researchers involved in analyses of LHC data, this book helps to establish a solid bridge between high precision data, existing or soon to be collected, and accurate measurements, including high-sensitivity tests of the Standard Model.

Quantum physics (quantum mechanics & quantum field theory) --- Mensuration & systems of measurement --- Particle & high-energy physics --- Angular Distributions of Particle Decays --- Angular Momentum in Experimental Hep --- Decay of Standard-model Vector Bosons --- Frame-invariant Relations --- LHC Angular Momentum --- Polarization Measurement in Hep --- Polarizazion Frames --- Particles (Nuclear physics) --- Polarization (Nuclear physics)