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VLSI test principles and architectures : design for testability
Authors: --- ---
ISBN: 9780080474793 0080474799 9780123705976 0123705975 128096684X 1493300865 9786610966844 9781280966842 Year: 2006 Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers,

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.·

Handbook of VLSI microlithography : principles, technology, and applications
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ISBN: 9786611411763 1591242754 9781591242758 9780815517801 0815517807 9780815514442 0815514441 6611411763 Year: 2001 Publisher: Park Ridge, N.J. : Norwich, N.Y. : Noyes Publications ; William Andrew Pub.,

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This handbook gives readers a close look at the entire technology of printing very high resolution and high density integrated circuit (IC) patterns into thin resist process transfer coatingsùincluding optical lithography, electron beam, ion beam, and x-ray lithography. The book's main theme is the special printing process needed to achieve volume high density IC chip production, especially in the Dynamic Random Access Memory (DRAM) industry. The book leads off with a comparison of various lithography methods, covering the three major patterning parameters of line/space, resolution, line edge

System-on-chip test architectures : nanometer design for testability
Authors: --- ---
ISBN: 9780123739735 012373973X 9780080556802 0080556809 1281100048 9781281100047 9786611100049 6611100040 Year: 2008 Publisher: Amsterdam ; Boston : Morgan Kaufmann Publishers,

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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master qu


Book
Plasma etching processes for interconnect realization in VLSI
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Year: 2015 Publisher: London, [England] ; Oxford, [England] : ISTE Press : Elsevier,

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This is the first of two books presenting the challenges and future prospects of plasma etching processes for microelectronics, reviewing the past, present and future issues of etching processes in order to improve the understanding of these issues through innovative solutions.


Book
Top-down digital VLSI design : from architectures to gate-level circuits and FPGAS
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ISBN: 0128007303 9780128007303 Year: 2015 Publisher: [Place of publication not identified] Morgan Kaufmann is an imprint of Elsevier

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Top-Down VLSI Design: From Architectures to Gate-Level Circuits and FPGAs represents a unique approach to learning digital design. Developed from more than 20 years teaching circuit design, Doctor Kaeslin’s approach follows the natural VLSI design flow and makes circuit design accessible for professionals with a background in systems engineering or digital signal processing. It begins with hardware architecture and promotes a system-level view, first considering the type of intended application and letting that guide your design choices. Doctor Kaeslin presents modern considerations for handling circuit complexity, throughput, and energy efficiency while preserving functionality. The book focuses on application-specific integrated circuits (ASICs), which along with FPGAs are increasingly used to develop products with applications in telecommunications, IT security, biomedical, automotive, and computer vision industries. Topics include field-programmable logic, algorithms, verification, modeling hardware, synchronous clocking, and more. Demonstrates a top-down approach to digital VLSI design. Provides a systematic overview of architecture optimization techniques. Features a chapter on field-programmable logic devices, their technologies and architectures. Includes checklists, hints, and warnings for various design situations. Emphasizes design flows that do not overlook important action items and which include alternative options when planning the development of microelectronic circuits.

Algorithms and parallel VLSI architectures III : proceedings of the International Workshop, Algorithms and Parallel VLSI Architectures III, Leuven, Belgium, August 29-31, 1994
Authors: --- ---
ISBN: 0444821066 9786611034153 1281034150 0080526977 9780444821065 9780080526973 9781281034151 6611034153 Year: 1995 Publisher: Amsterdam ; New York : Elsevier,

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A comprehensive overview of the current evolution of research in algorithms, architectures and compilation for parallel systems is provided by this publication. The contributions focus specifically on domains where embedded systems are required, either oriented to application-specific or to programmable realisations. These are crucial in domains such as audio, telecom, instrumentation, speech, robotics, medical and automotive processing, image and video processing, TV, multimedia, radar and sonar. The book will be of particular interest to the academic community because of the detailed des

VLSI test principles and architectures : design for testability
Authors: --- ---
ISBN: 128096684X 9786610966844 0080474799 0123705975 1493300865 9780080474793 9780123705976 Year: 2006 Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers,

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.·


Book
Formal verification : an essential toolkit for modern VLSI design
Authors: --- ---
ISBN: 0323956122 0323956130 9780323956130 9780323956123 Year: 2023 Publisher: Cambridge, MA : Morgan Kaufmann Publishers,

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Formal Verification: An Essential Toolkit for Modern VLSI Design, Second Edition presents practical approaches for design and validation, with hands-on advice to help working engineers integrate these techniques into their work. Formal Verification (FV) enables a designer to directly analyze and mathematically explore the quality or other aspects of a Register Transfer Level (RTL) design without using simulations. This can reduce time spent validating designs and more quickly reach a final design for manufacturing. Building on a basic knowledge of SystemVerilog, this book demystifies FV and presents the practical applications that are bringing it into mainstream design and validation processes. Every chapter in the second edition has been updated to reflect evolving FV practices and advanced techniques. In addition, a new chapter, Formal Signoff on Real Projects, provides guidelines for implementing signoff quality FV, completely replacing some simulation tasks with significantly more productive FV methods. After reading this book, readers will be prepared to introduce FV in their organization to effectively deploy FV techniques that increase design and validation productivity.

Very large databases 2002 : proceedings of the Twenty-eighth International Conference on Very Large Data Bases, Hong Kong SAR, China, 20-23 August, 2002
Authors: ---
ISBN: 9781558608696 1558608699 9780080514918 008051491X 1281035343 9781281035349 9786611035341 6611035346 Year: 2002 Publisher: St. Louis, Mo. : Morgan Kaufmann Publishers,

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Proceedings of the 28th Annual International Conference on Very Large Data Bases held in Hong Kong, China on August 20-23, 2002. Organized by the VLDB Endowment, VLDB is the premier international conference on database technology.


Book
VHDL 101 : everything you need to know to get started
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ISBN: 1282954466 9786612954467 0080959393 1856177041 9781856177047 9781282954465 9780080959399 Year: 2011 Publisher: Oxford, U.K. ; Burlington, Mass. : Newnes, an imprint of Elsevier,

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VHDL (VHSIC Hardware Description Language) is a hardware programming language commonly used for FPGA or ASIC designs. FPGAs and the like are often found within larger applications such as cell phones, medical imagers, and personal media devices. As these devices are becoming more ubiquitous so the need for engineers fluent in VHDL design grows. Engineers commonly face an immediate need to learn a language or technique quickly and this book can answer that requirement. Bill Kafig, Xilinx, swiftly brings the reader up to speed on techniques and functions commonly used as well as commands and dat

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