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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Quantum mechanics. Quantumfield theory --- Statistical physics --- Solid state physics --- Matter physics --- Chemical structure --- General biophysics --- Materials sciences --- Electrical engineering --- Biotechnology --- EMI (electromagnetic interference) --- materiaalkennis --- materie (fysica) --- biofysica --- quantummechanica --- nanotechniek --- biotechnologie --- fysica --- moleculaire biologie --- Nanotechnology. --- Surfaces (Physics). --- Engineering. --- Characterization and Evaluation of Materials. --- Surfaces and Interfaces, Thin Films. --- Nanotechnology and Microengineering. --- Condensed Matter Physics. --- Biological and Medical Physics, Biophysics. --- Molecular technology --- Nanoscale technology --- High technology --- Construction --- Industrial arts --- Technology --- Physics --- Surface chemistry --- Surfaces (Technology) --- Materials science. --- Materials—Surfaces. --- Thin films. --- Condensed matter. --- Biophysics. --- Biological physics. --- Biological physics --- Biology --- Medical sciences --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids --- Films, Thin --- Solid film --- Solid state electronics --- Coatings --- Thick films --- Material science --- Physical sciences --- Scanning probe microscopy. --- Nanostructured materials --- Microscopy.