Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Scanning tunneling microscopy --- Surfaces (Physics) --- Congresses. --- 531.728 <063> --- 537.533.35 <063> --- -Surfaces (Physics) --- -#WSCH:MODS --- STM (Microscopy) --- Scanning probe microscopy --- Surface measurement using microscope--Congressen --- Electron microscopy--Congressen --- Congresses --- 537.533.35 <063> Electron microscopy--Congressen --- 531.728 <063> Surface measurement using microscope--Congressen --- #WSCH:MODS --- Scanning tunneling microscopy - Congresses. --- Surfaces (Physics) - Congresses.

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Ion implantation --- Surfaces (Physics) --- Ion bombardment --- Congresses --- -Ion implantation --- -Surfaces (Physics) --- -538.91 <063> --- 538.97 <063> --- Implantation, Ion --- Ion plating --- Beams, Ion --- Bombardment, Ion --- Impact, Ion --- Ion beams --- Ion impact --- Ionic bombardment --- Collisions (Nuclear physics) --- Ions --- Structures, including transitions--Congressen --- Special geometry and interaction with particles and radiation--Congressen --- 538.97 <063> Special geometry and interaction with particles and radiation--Congressen --- 538.91 <063> Structures, including transitions--Congressen --- 538.91 <063> --- Ion implantation - Congresses --- Surfaces (Physics) - Congresses --- Ion bombardment - Congresses