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This book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called "rect" has been extensively investigated as a two-dimensional metal. Another crystalline phase called "hex" was also suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds. The present study demonstrates interesting properties of indium itself, which is a p-block metal both with metallicity and covalency. In this book, readers also see principles of various surface analysis techniques and learn how to use them and analyze the results in the real systems. This book is useful to researchers and students interested in surface science, particularly ultrathin metal films on semiconductor surfaces.

Solid state physics --- Physics --- Surface chemistry --- Inorganic chemistry --- Metallurgy --- oppervlakte-onderzoek --- anorganische chemie --- fysica --- metalen --- fysicochemie --- Metallic films. --- Semiconductor films.

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The Light Metals symposia at the TMS Annual Meeting & Exhibition present the most recent developments, discoveries, and practices in primary aluminum science and technology. The annual Light Metals volume has become the definitive reference in the field of aluminum production and related light metal technologies. The 2017 collection includes papers from the following symposia: Alumina and Bauxite Aluminum Alloys, Processing, and Characterization Aluminum Reduction Technology Cast Shop Technology Cast Shop Technology: Recycling and Sustainability Joint Session Electrode Technology The Science of Melt Refining: An LMD Symposium in Honor of Christian Simensen and Thorvald Abel Engh.

Physics --- Surface chemistry --- Metals and their compounds --- Materials sciences --- Applied physical engineering --- materiaalkennis --- oppervlakte-onderzoek --- metalen --- Metals. --- Materials science. --- Engineering—Materials. --- Metallic Materials. --- Characterization and Evaluation of Materials. --- Materials Engineering. --- Material science --- Physical sciences --- Metallic elements --- Chemical elements --- Ores --- Metallurgy

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Photoelectron spectroscopy is now becoming more and more required to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. The energy resolution was much improved in the last decade down to 1 meV in the low photon energy region. Now this technique is available from a few eV up to 10 keV by use of lasers, electron cyclotron resonance lamps in addition to synchrotron radiation and X-ray tubes. High resolution angle resolved photoelectron spectroscopy (ARPES) is now widely applied to band mapping of materials. It attracts a wide attention from both fundamental science and material engineering. Studies of the dynamics of excited states are feasible by time of flight spectroscopy with fully utilizing the pulse structures of synchrotron radiation as well as lasers including the free electron lasers (FEL). Spin resolved studies also made dramatic progress by using higher efficiency spin detectors and two dimensional spin detectors. Polarization dependent measurements in the whole photon energy spectrum of the spectra provide useful information on the symmetry of orbitals. The book deals with the fundamental concepts and approaches for the application of this technique to materials studies. Complementary techniques such as inverse photoemission, photoelectron diffraction, photon spectroscopy including infrared and X-ray and scanning tunneling spectroscopy are presented. This book provides not only a wide scope of photoelectron spectroscopy of solids but also extends our understanding of electronic structures beyond photoelectron spectroscopy.

Optics. Quantum optics --- Electromagnetism. Ferromagnetism --- Physics --- Surface chemistry --- Physicochemistry --- Organic reaction mechanisms and kinetics --- Materials sciences --- thermodynamica --- materiaalkennis --- oppervlakte-onderzoek --- quantumchemie --- elektrodynamica --- fysica --- kogellagers --- fysicochemie --- optica --- Photoelectron spectroscopy. --- Spectroscopie de photoélectrons --- EPUB-LIV-FT LIVPHYSI SPRINGER-B

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Physics --- Optics. Quantum optics --- Solid state physics --- Surface chemistry --- Theoretical spectroscopy. Spectroscopic techniques --- MRI (magnetic resonance imaging) --- legeringen --- vaste stof --- materie (fysica) --- oppervlakte-onderzoek --- spectroscopie --- microscopie --- fysica --- X-ray photoelectron spectroscopy --- Auger effect. --- Spectroscopie photoélectronique des rayons X --- Effet Auger --- EPUB-LIV-FT LIVCHIMI SPRINGER-B

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This book provides a detailed understanding of various forming, machining, and post processing techniques. Working principle, process mechanism, salient features and latest developments are primarily focused. It presents some basic and specialized processes to produce quality engineered parts. This book also incorporates some investigations on modelling, simulation and optimization of the aforementioned processes to improve quality and performance, productivity, and sustainability.

Physics --- Surface chemistry --- Materials sciences --- Materials processing --- Machine elements --- Applied physical engineering --- corrosiepreventie --- tribologie --- materiaalkennis --- oppervlakte-onderzoek --- materiaalproductie --- machines --- fysicochemie --- materiaalonderzoek --- corrosie --- Surfaces (Technology). --- Thin films. --- Coatings. --- Tribology. --- Corrosion and anti-corrosives. --- Machinery. --- Surfaces, Interfaces and Thin Film. --- Corrosion. --- Machinery and Machine Elements.