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The proceedings of the Third International Conference on Electron Microscopy, London, 1954

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Book
Electron Microscopy
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Year: 2022 Publisher: London : IntechOpen,

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This book provides an overview of the principles and types of electron microscopes. It also describes the different practical applications of electron microscopes, ranging from particle analysis and materials characterization to industrial failure analysis and process control. Over eight chapters divided into two sections, this book gives readers a comprehensive and updated review of the latest advances in electron microscopy.


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Rapport Europees Congres Toegepaste Electronenmicroscopie, Gent 7-10 April 1954
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Year: 1954 Publisher: Gent : Rijksuniversiteit,

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The transmission electron microscope
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ISBN: 953516192X 9535104500 Year: 2012 Publisher: IntechOpen

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The book "The Transmission Electron Microscope" contains a collection of research articles submitted by engineers and scientists to present an overview of different aspects of TEM from the basic mechanisms and diagnosis to the latest advancements in the field. The book presents descriptions of electron microscopy, models for improved sample sizing and handling, new methods of image projection, and experimental methodologies for nanomaterials studies. The selection of chapters focuses on transmission electron microscopy used in material characterization, with special emphasis on both the theoretical and experimental aspect of modern electron microscopy techniques. I believe that a broad range of readers, such as students, scientists and engineers will benefit from this book.


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In-situ transmission electron microscopy
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ISBN: 9811968454 9811968446 Year: 2023 Publisher: Singapore : Springer,

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This book focuses on in-situ transmission electron microscopy (TEM), an investigatory technique used to observe a sample’s response to a given stimulus (including electron irradiation, thermal excitation, mechanical force, optical excitation, electric and magnetic fields) at the nanoscale in real time. The book introduces readers to the technical strategy behind the in-situ technique and its developments. It reviews the research frontiers of using in-situ TEM in energy conversion and storage, catalysis, nanomaterials synthesis, nanoelectronics, etc. Furthermore, it discusses the future prospects for in-situ TEM. The book offers a valuable guide for all undergraduate and graduate students who are interested in TEM characterization technology. It also serves as a reference source on cutting-edge in-situ techniques for researchers and engineers.


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The electron microscope and its application to materials problems
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Year: 1949 Publisher: Dayton : U. S. Air Force, Air Materiel Command,

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Introduction to electron microscopy
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Year: 1953 Publisher: New York : McGraw-Hill,

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A mirror electron microscope
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Year: 1968 Publisher: Delft : Waltman N. V.,

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Le microscope électronique
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Year: 1963 Volume: 1045 Publisher: Paris : Presses universitaires de France,

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Book
Early history of the electron microscope
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Year: 1968 Publisher: San Francisco, Calif. : San Francisco Press

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