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Electronic apparatus and appliances --- Automatic test equipment --- Automatic test equipment. --- Testing --- Testing.

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Service life (Engineering) --- Plant maintenance --- Automatic test equipment --- Durée de vie (Ingénierie) --- Usines --- Equipement d'essai automatique --- Entretien

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.

Electronic apparatus and appliances --- Automatic test equipment. --- Testing. --- Design and construction. --- Systems engineering. --- Computer engineering. --- Computer aided design. --- Circuits and Systems. --- Electrical Engineering. --- Computer-Aided Engineering (CAD, CAE) and Design. --- Electronic circuits. --- Electrical engineering. --- Computer-aided engineering. --- CAE --- Engineering --- Electric engineering --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Data processing --- ACE (Automatic checkout equipment) --- ATE (Automatic test equipment) --- Automatic checkout equipment --- Built-in test equipment --- Electronic instruments --- Nondestructive testing --- Equipment and supplies

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This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. .

Automatic test equipment. --- Radio circuits -- Design and construction. --- Radio circuits -- Testing. --- Systems on a chip -- Design and construction. --- Systems on a chip -- Testing. --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Radio frequency. --- Radiofrequency --- Engineering. --- Electronic circuits. --- Circuits and Systems. --- Signal, Image and Speech Processing. --- Electronic Circuits and Devices. --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Construction --- Industrial arts --- Technology --- Frequencies of oscillating systems --- Radio measurements --- Radio waves --- Systems engineering. --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Design and construction --- Signal processing. --- Image processing. --- Speech processing systems. --- Computational linguistics --- Electronic systems --- Information theory --- Modulation theory --- Oral communication --- Speech --- Telecommunication --- Singing voice synthesizers --- Pictorial data processing --- Picture processing --- Processing, Image --- Imaging systems --- Optical data processing --- Processing, Signal --- Information measurement --- Signal theory (Telecommunication)