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Ellipsometry in the measurement of surfaces and thin films : Symposium proceedings, Washington 1963 : Symposium held September 5-6, 1963 at the National Bureau of standards
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Authors:
Passaglia, Elio
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Stromberg, R. R.
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Kruger, Jerome
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Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Year: 1964 Publisher: Washington : U.S. National Bureau of Standards,
Year: 1964 Publisher: Washington : U.S. National Bureau of Standards,
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Abstract
Keywords
Polarization (Light) --- Surfaces (Technology) --- Thin films. --- Polarisation (Lumière) --- Surfaces (Technologie)
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