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Integrated circuit quality and reliability.
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ISBN: 0824792831 Year: 1995 Publisher: New York (N.Y.) Dekker

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Applied life data analysis
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ISBN: 0471094587 Year: 1982 Publisher: New York Wiley

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Recent advances in life-testing and reliability
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ISBN: 0849389720 Year: 1995 Publisher: Boca Raton CRC

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Modern statistical and mathematical methods in reliability
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ISBN: 9812563563 9789812563569 9812703373 9789812703378 1281372935 9781281372932 9786611372934 6611372938 Year: 2005 Volume: v. 10 Publisher: Hackensack, N.J. World Scientific

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Abstract

This volume contains extended versions of 28 carefully selected and reviewed papers presented at The Fourth International Conference on Mathematical Methods in Reliability in Santa Fe, New Mexico, June 21-25, 2004, the leading conference in reliability research. The meeting serves as a forum for discussing fundamental issues on mathematical methods in reliability theory and its applications. A broad overview of current research activities in reliability theory and its applications is provided with coverage on reliability modeling, network and system reliability, Bayesian methods, survival anal


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Continuous delivery : reliable software releases through build, test, and deployment automation
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ISBN: 9780321601919 0321601912 Year: 2011 Publisher: Boston, Mass. Pearson Education, Inc.

Influence of temperature on microelectronics and system reliability
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ISBN: 0849394503 9780849394508 Year: 1997 Publisher: Boca Raton CRC

Repairable systems reliability: modeling, inference, misconceptions and their causes
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ISBN: 0824772768 9780824772765 Year: 1984 Volume: 7 Publisher: New York Dekker

Statistical analysis of reliability and life-testing models: theory and methods
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ISBN: 0824766652 9780824766658 Year: 1978 Volume: 24 Publisher: New York Dekker

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