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These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisla, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and i
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The papers published in this volume of Solid State Phenomena are written on the basis of selected presentations from the XV International Conference on Electron Microscopy EM2014, which took place in Kraków from the 15th to the 18th of September 2014. The papers present the recent results of the applications of electron microscopy methods for microstructural studies in materials science. The main focus of the conference was on applying electron microscopy methods in material science, physics, chemistry, and the earth and life sciences. The 21 papers consider such topics as the mechanical and s
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TEM and SEM have contributed greatly to the progress of various research fields, which has been accelerated in the last few decades by highly functional electron microscopes and microscopy. In this tide of microscopy, various microscopic methods have been developed to make clear many unsolved problems, e.g. pulse beam TEM, environmental microscopy, correlative microscopy, etc. In this book, a number of reviews have been collected concerning these subjects. We think that the content in each chapter is impressive, and we hope this book will contribute to future advances in electron microscopy, materials science, and biomedicine.
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In the 4th edition, applications sections have been updated including the semiconductor industry, superconductor research solid state chemistry and nanoscience, and metallurgy mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography aberration correction, field-emission guns, imaging filters super-resolution methods, Ptychography, Ronchigrams, tomography image quantification and simulation, and more.
High resolution electron microscopy. --- Electron microscopy. --- Microscopy --- Electron microscopy
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Scanning electron microscopy. --- Scanning electron microscopy --- Electron microscopy
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"Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook."--Provided by publisher.
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This book provides an overview of the principles and types of electron microscopes. It also describes the different practical applications of electron microscopes, ranging from particle analysis and materials characterization to industrial failure analysis and process control. Over eight chapters divided into two sections, this book gives readers a comprehensive and updated review of the latest advances in electron microscopy.
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This book provides an overview of the principles and types of electron microscopes. It also describes the different practical applications of electron microscopes, ranging from particle analysis and materials characterization to industrial failure analysis and process control. Over eight chapters divided into two sections, this book gives readers a comprehensive and updated review of the latest advances in electron microscopy.
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