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This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation "recipes." Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This practical Handbook is an essential reference for anyone who uses these instruments. It assumes only an elementary knowledge of preparation techniques but also serves as an authoritative guide for more experienced microscopists.

Biological Microscopy. --- Condensed matter. --- Scanning electron microscopy. --- X-ray microanalysis. --- Microscopy --- Materials Science --- Chemical & Materials Engineering --- Biology --- Health & Biological Sciences --- Engineering & Applied Sciences --- Scanning electron microscopy --- X-ray microanalysis --- Materials science. --- Microscopy. --- Biophysics. --- Biological physics. --- Materials Science. --- Characterization and Evaluation of Materials. --- Condensed Matter Physics. --- Biophysics and Biological Physics. --- Microprobe analysis --- Electron microscopy --- Surfaces (Physics). --- Biological and Medical Physics, Biophysics. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Physics --- Surface chemistry --- Surfaces (Technology) --- Biological physics --- Medical sciences --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids --- Material science --- Physical sciences

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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective andmeaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to "read it all" to understand a topic Includes an online supplement—an extensive "Database of Electronic–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3.

Materials science. --- Spectroscopy. --- Microscopy. --- Physical measurements. --- Measurement. --- Materials Science. --- Characterization and Evaluation of Materials. --- Spectroscopy and Microscopy. --- Biological Microscopy. --- Spectroscopy/Spectrometry. --- Measurement Science and Instrumentation. --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Material science --- Physical sciences --- Qualitative --- Surfaces (Physics). --- Physics --- Surface chemistry --- Surfaces (Technology) --- Scanning electron microscopy --- X-ray microanalysis --- Microscopy, Electron, Scanning --- Electron Scanning Microscopy --- Scanning Electron Microscopy --- Electron Microscopies, Scanning --- Electron Microscopy, Scanning --- Electron Scanning Microscopies --- Microscopies, Electron Scanning --- Microscopies, Scanning Electron --- Microscopy, Electron Scanning --- Microscopy, Scanning Electron --- Scanning Electron Microscopies --- Scanning Microscopies, Electron --- Scanning Microscopy, Electron --- Microprobe analysis --- Electron microscopy --- Spectrometry --- Scanning electron microscopy. --- X-ray microanalysis. --- Measurement   . --- Analytical chemistry

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Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

X-ray spectroscopy. --- X-ray microanalysis. --- Microprobe analysis --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- Spectrum analysis --- Surfaces (Physics). --- Spectroscopy. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Measurement Science and Instrumentation. --- Spectroscopy/Spectrometry. --- Surface and Interface Science, Thin Films. --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Physics --- Surface chemistry --- Surfaces (Technology) --- Qualitative --- Microscopy. --- Materials—Surfaces. --- Thin films. --- Physical measurements. --- Measurement   . --- Interfaces (Physical sciences). --- Surfaces (Physics) --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- XES (X-ray emission spectroscopy) --- Spectrometry --- Analytical chemistry