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Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Rietveld method. --- X-rays --- Diffraction. --- Diffraction --- PFSR (X-ray crystallography) --- Profile refinement (X-ray crystallography) --- Rietveld analysis --- Rietveld refinement --- Whole-pattern-fitting structure refinement (X-ray crystallography) --- X-ray crystallography --- Technique --- Mineralogy. --- Crystallography. --- Chemistry, inorganic. --- Chemistry, Physical organic. --- Crystallography and Scattering Methods. --- Inorganic Chemistry. --- Physical Chemistry. --- Chemistry, Physical organic --- Chemistry, Organic --- Chemistry, Physical and theoretical --- Inorganic chemistry --- Chemistry --- Inorganic compounds --- Leptology --- Physical sciences --- Mineralogy --- Physical geology --- Crystallography --- Minerals --- Inorganic chemistry. --- Physical chemistry. --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry

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The advent of additive manufacturing (AM) processes applied to the fabrication of structural components creates the need for design methodologies supporting structural optimization approaches that take into account the specific characteristics of the process. While AM processes enable unprecedented geometrical design freedom, which can result in significant reductions of component weight, on the other hand they have implications in the fatigue and fracture strength due to residual stresses and microstructural features. This is linked to stress concentration effects and anisotropy that still warrant further research. This Special Issue of Applied Sciences brings together papers investigating the features of AM processes relevant to the mechanical behavior of AM structural components, particularly, but not exclusively, from the viewpoints of fatigue and fracture behavior. Although the focus of the issue is on AM problems related to fatigue and fracture, articles dealing with other manufacturing processes with related problems are also be included.

residual stress/strain --- electron beam melting --- diffraction --- Ti-6Al-4V --- electron backscattered diffraction --- X-ray diffraction --- Selective Laser Melting --- Ti6Al4V --- residual stress --- deformation --- preheating --- relative density --- powder degradation --- wire and arc additive manufacturing --- additive manufacturing --- microstructure --- mechanical properties --- applications --- Fe-based amorphous coating --- laser cladding --- property --- titanium --- microstructural modeling --- metal deposition --- finite element method --- dislocation density --- vacancy concentration --- directed energy deposition --- defects --- hardness --- alloy 718 --- hot isostatic pressing --- post-treatment --- Alloy 718 --- surface defects --- encapsulation --- coating --- fatigue crack growth (FCG) --- electron beam melting (EBM) --- hydrogen embrittlement (HE) --- wire arc additive manufacturing --- precipitation hardening --- Al–Zn–Mg–Cu alloys --- microstructure characterisation --- titanium alloy --- Ti55511 --- synchrotron --- XRD --- microscopy --- SLM --- EBM --- EBSD --- Rietveld analysis --- WAAM --- GMAW --- energy input per unit length --- processing strategy --- contact tip to work piece distance --- electrical stickout