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book (2)

periodical (1)

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1986 (1)

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Periodical

Secondary ion mass spectrometry
Author: International Conference on Secondary Ion Mass Spectrometry
Publisher: Berlin

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Spectrometric and optical chemical analysis --- fysicochemie

Book

Secondary ion mass spectrometry SIMS XIII: proceedings of the 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Nara, Japan, November 11-16, 2001
Authors: Benninghoven, A. --- Nihei, Y. --- Kudo, M. --- International Conference on Secondary Ion Mass Spectrometry
Year: 2003 Publisher: New York Elsevier Science

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Spectrometric and optical chemical analysis --- fysicochemie

Book

Secondary ion mass spectrometry SIMS V : proceedings of the fifth international conference, Washington, D.C., September 30-October 4, 1985.
Authors: Benninghoven, A. --- Colton, Richard J. --- Simons, David S. --- Werner, H. W. --- International conference on secondary ion mass spectrometry.
ISBN: 3540162631 0387162631 3642827268 3642827241 9780387162638 Year: 1986 Volume: 44 Publisher: Berlin : Springer,

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Spectrometric and optical chemical analysis --- fysicochemie --- Secondary ion mass spectroscopy --- Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires --- Spectrométrie de masse des ions secondaires.

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