Narrow your search

Library

Odisee (74)

Thomas More Kempen (74)

Thomas More Mechelen (74)

UCLL (74)

VIVES (74)

KU Leuven (66)

ULiège (56)

ULB (55)

LUCA School of Arts (52)

VUB (20)

More...

Resource type

book (73)

digital (1)

periodical (1)


Language

English (73)

German (1)


Year
From To Submit

2023 (2)

2022 (3)

2021 (1)

2020 (1)

2019 (2)

More...
Listing 1 - 10 of 74 << page
of 8
>>
Sort by

Book
Scanning probe microscopy
Authors: ---
ISBN: 1621980324 1283145154 9786613145154 9814324779 9789814324779 9789814324762 9814324760 9781621980322 9781283145152 Year: 2011 Publisher: Singapore ; Hackensack, N.J. : World Scientific Pub. Co.,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries. The rising importance of SPM demands a concise treatm


Book
Elektrochemische Herstellung und Charakterisierung von Nanostrukturen - Entwicklung ultrascharfer STM-Spitzen als Nanoelektroden
Author:
Year: 2005 Publisher: [Place of publication not identified] : KIT Scientific Publishing,

Loading...
Export citation

Choose an application

Bookmark

Abstract

In der vorliegenden Arbeit wurde ein elektrochemisches Raster-Sonden-Mikroskop dazu benutzt, gezielt Nanostrukturen herzustellen und zu charakterisieren. Das elektrochemische Umfeld bietet gegenüber den sonst angewandten Techniken den Vorteil, dass die Über- und Untersättigung an den beiden Arbeitselektroden frei eingestellt werden kann. Diese Methode erlaubt es lokal Nanostrukturen definierter Größe herzustellen. Mittels einer selbst aufgebauten UHV-Apparatur konnten Präparationstechniken zur reproduzierbaren Herstellung von geometrisch hoch definierten STM-Spitzen für nahezu jedes Metall entwickelt werden. Derart qualitativ hochwertige STM-Spitzen ermöglichten erstmals einen Strommessbereich von 10-6 bis10-12 Ampere abzudecken. Die entwickelten Instrumente konnten zur Untersuchung der Systeme Co bzw. Ni auf Au(111)-Substraten eingesetzt werden. Das Verfahren zur Erzeugung magnetischer Nanostrukturen wurde optimiert und erste spektroskopische Messungen an der Fest-/ Flüssiggrenzfläche konnten durchgeführt werden.


Book
Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology
Author:
ISBN: 1283860465 1455730599 1455730580 0128133481 9781455730599 9781455730582 9780128133484 0128133473 9780128133477 Year: 2013 Publisher: Waltham, Mass. : Elsevier,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous adv


Book
Growth of antimony on copper : a scanning tunneling microscopy study
Author:
ISBN: 9783960676621 396067662X 3960671628 9783960671626 Year: 2017 Publisher: Hamburg, [Germany] : Anchor Academic Publishing,

Loading...
Export citation

Choose an application

Bookmark

Abstract


Book
Scanning probe microscopy : the lab on a tip
Authors: --- ---
ISBN: 3030370895 3030370887 Year: 2021 Publisher: Cham, Switzerland : Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Local probe techniques for corrosion research
Authors: ---
ISBN: 9781845692599 1845692594 9781845692360 9781420054057 Year: 2007 Publisher: Cambridge, England ; Boca Raton, Florida : Woodhead Publishing Limited : CRC Press,

Loading...
Export citation

Choose an application

Bookmark

Abstract

The effective investigation of corrosion requires the use of methods that can probe material surfaces at the atomic or molecular level and can be used in situ. This important collection reviews the range of techniques available and how they can be used to analyse different types of corrosion.A number of chapters discuss the use of scanning probe microscopy techniques such as electrochemical scanning tunnelling microscopy and atomic force microscopy (EC-STM and EC-AFM). Other chapters analyse local electrochemical techniques such as scanning electrochemical microscopy (SECM), scanning v


Book
Nanoscale processes on insulating surfaces
Authors: ---
ISBN: 1282757490 9786612757495 9812837639 9789812837639 9812837620 9789812837622 9781282757493 Year: 2009 Publisher: Singapore ; Hackensack, N.J. : World Scientific,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Ionic crystals are among the simplest structures in nature. They can be easily cleaved in air and in vacuum, and the resulting surfaces are atomically flat on areas hundreds of nanometers wide. With the development of scanning probe microscopy, these surfaces have become an ideal "playground" to investigate several phenomena occurring on the nanometer scale. This book focuses on the fundamental studies of atomically resolved imaging, nanopatterning, metal deposition, molecular self-assembling and nanotribological processes occurring on ionic crystal surfaces. Here, a significant variety of st


Book
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology
Author:
ISBN: 0128133473 Year: 2018 Publisher: San Diego : Elsevier Science,


Book
Fundamentals of atomic force microscopy.
Author:
ISBN: 9789814630344 9814630349 9789814630351 9814630357 9814630365 9789814630368 Year: 2016 Volume: 4 Publisher: New Jersey : World Scientific,

Loading...
Export citation

Choose an application

Bookmark

Abstract

"The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)"--


Book
Instrumental community : probe microscopy and the path to nanotechnology
Author:
ISBN: 9780262134941 9780262298186 026229818X 128332170X 9781283321709 0262134942 9786613321701 0262297248 9780262297240 6613321702 Year: 2011 Publisher: Cambridge, Mass. : MIT Press,

Loading...
Export citation

Choose an application

Bookmark

Abstract

In this volume, the author argues that this technology-centric view does not explain how these microscopes helped to launch nanotechnology - and fails to acknowledge the agency of the microscopists in making the STM and its variants critically important tools.

Listing 1 - 10 of 74 << page
of 8
>>
Sort by