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Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries. The rising importance of SPM demands a concise treatm
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In der vorliegenden Arbeit wurde ein elektrochemisches Raster-Sonden-Mikroskop dazu benutzt, gezielt Nanostrukturen herzustellen und zu charakterisieren. Das elektrochemische Umfeld bietet gegenüber den sonst angewandten Techniken den Vorteil, dass die Über- und Untersättigung an den beiden Arbeitselektroden frei eingestellt werden kann. Diese Methode erlaubt es lokal Nanostrukturen definierter Größe herzustellen. Mittels einer selbst aufgebauten UHV-Apparatur konnten Präparationstechniken zur reproduzierbaren Herstellung von geometrisch hoch definierten STM-Spitzen für nahezu jedes Metall entwickelt werden. Derart qualitativ hochwertige STM-Spitzen ermöglichten erstmals einen Strommessbereich von 10-6 bis10-12 Ampere abzudecken. Die entwickelten Instrumente konnten zur Untersuchung der Systeme Co bzw. Ni auf Au(111)-Substraten eingesetzt werden. Das Verfahren zur Erzeugung magnetischer Nanostrukturen wurde optimiert und erste spektroskopische Messungen an der Fest-/ Flüssiggrenzfläche konnten durchgeführt werden.
Scanning tunneling microscopy. --- Scanning probe microscopy.
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Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous adv
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Scanning tunneling microscopy. --- STM (Microscopy) --- Scanning probe microscopy
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The effective investigation of corrosion requires the use of methods that can probe material surfaces at the atomic or molecular level and can be used in situ. This important collection reviews the range of techniques available and how they can be used to analyse different types of corrosion.A number of chapters discuss the use of scanning probe microscopy techniques such as electrochemical scanning tunnelling microscopy and atomic force microscopy (EC-STM and EC-AFM). Other chapters analyse local electrochemical techniques such as scanning electrochemical microscopy (SECM), scanning v
Corrosion and anti-corrosives. --- Scanning probe microscopy. --- Spectrum analysis.
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Ionic crystals are among the simplest structures in nature. They can be easily cleaved in air and in vacuum, and the resulting surfaces are atomically flat on areas hundreds of nanometers wide. With the development of scanning probe microscopy, these surfaces have become an ideal "playground" to investigate several phenomena occurring on the nanometer scale. This book focuses on the fundamental studies of atomically resolved imaging, nanopatterning, metal deposition, molecular self-assembling and nanotribological processes occurring on ionic crystal surfaces. Here, a significant variety of st
Scanning probe microscopy. --- Nanoelectronics. --- Ionic crystals. --- Thin films --- Surfaces.
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"The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)"--
Atomic force microscopy --- Atomic force microscopy. --- AFM (Microscopy) --- Scanning probe microscopy
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In this volume, the author argues that this technology-centric view does not explain how these microscopes helped to launch nanotechnology - and fails to acknowledge the agency of the microscopists in making the STM and its variants critically important tools.
Nanotechnology --- Scanning probe microscopy. --- Intellectual cooperation --- Scientists --- Research --- Professional employees --- Cooperation, Intellectual --- Cultural exchange programs --- International cooperation --- International education --- Library cooperation --- Scanned probe microscopy --- Scanning electron microscopy --- Molecular technology --- Nanoscale technology --- High technology --- SCIENCE, TECHNOLOGY & SOCIETY/General --- Scanning probe microscopy
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