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Measurement is a multidisciplinary experimental science. Measurement systems synergistically blend science, engineering and statistical methods to provide fundamental data for research, design and development, control of processes and operations, and facilitate safe and economic performance of systems. In recent years, measuring techniques have expanded rapidly and gained maturity, through extensive research activities and hardware advancements. With individual chapters authored by eminent professionals in their respective topics, Applied Measurement Systems attempts to provide a comprehensive presentation and in-depth guidance on some of the key applied and advanced topics in measurements for scientists, engineers and educators.

Measurement. --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Engineering: general

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This book is a collection of 24 chapters concerning the developments within the Measurement Systems field of study.The collection includes scholarly contributions by various authors and edited by a group of experts pertinent to Measurement Systems. Each contribution comes as a separate chapter complete in itself but directly related to the book's topics and objectives. The target audience comprises scholars and specialists in the field.

Measurement. --- Detectors. --- Sensors --- Engineering instruments --- Physical instruments --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Applied optics

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Measurement. --- Metrology. --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Science --- Measurement --- Weights and measures

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Measurement. --- Measuring instruments. --- Instruments, Measuring --- Measurement --- Measuring tools --- Scientific apparatus and instruments --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Instruments

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This Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach.

Optical physics --- Mensuration & systems of measurement --- surface metrology --- profilometry --- interferometry --- low-coherence interferometry --- semiconductor manufacturing --- optical metrology --- Open Access