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Book
Nanoelectronic Materials, Devices and Modeling
Authors: ---
ISBN: 3039212265 3039212257 Year: 2019 Publisher: MDPI - Multidisciplinary Digital Publishing Institute

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Abstract

As CMOS scaling is approaching the fundamental physical limits, a wide range of new nanoelectronic materials and devices have been proposed and explored to extend and/or replace the current electronic devices and circuits so as to maintain progress with respect to speed and integration density. The major limitations, including low carrier mobility, degraded subthreshold slope, and heat dissipation, have become more challenging to address as the size of silicon-based metal oxide semiconductor field effect transistors (MOSFETs) has decreased to nanometers, while device integration density has increased. This book aims to present technical approaches that address the need for new nanoelectronic materials and devices. The focus is on new concepts and knowledge in nanoscience and nanotechnology for applications in logic, memory, sensors, photonics, and renewable energy. This research on nanoelectronic materials and devices will be instructive in finding solutions to address the challenges of current electronics in switching speed, power consumption, and heat dissipation and will be of great interest to academic society and the industry.

Keywords

quantum mechanical --- n/a --- neuromorphic computation --- off-current (Ioff) --- double-gate tunnel field-effect-transistor --- topological insulator --- back current blocking layer (BCBL) --- CMOS power amplifier IC --- information integration --- distributed Bragg --- spike-timing-dependent plasticity --- electron affinity --- enhancement-mode --- current collapse --- gallium nitride (GaN) --- band-to-band tunneling --- vertical field-effect transistor (VFET) --- ionic liquid --- luminescent centres --- thermal coupling --- vision localization --- PC1D --- UAV --- ZnO/Si --- dual-switching transistor --- memristor --- field-effect transistor --- higher order synchronization --- shallow trench isolation (STI) --- memristive device --- on-current (Ion) --- low voltage --- reflection transmision method --- dielectric layer --- source/drain (S/D) --- high efficiency --- nanostructure synthesis --- InAlN/GaN heterostructure --- supercapacitor --- high-electron mobility transistor (HEMTs) --- heterojunction --- p-GaN --- recessed channel array transistor (RCAT) --- gate field effect --- charge injection --- saddle FinFET (S-FinFET) --- L-shaped tunnel field-effect-transistor --- conductivity --- energy storage --- hierarchical --- PECVD --- sample grating --- MISHEMT --- bistability --- threshold voltage (VTH) --- bandgap tuning --- oscillatory neural networks --- UV irradiation --- Mott transition --- third harmonic tuning --- topological magnetoelectric effect --- cross-gain modulation --- 2D material --- solar cells --- silicon on insulator (SOI) --- Green’s function --- optoelectronic devices --- semiconductor optical amplifier --- ZnO films --- graphene --- AlGaN/GaN --- polarization effect --- two-photon process --- conductive atomic force microscopy (cAFM) --- 2DEG density --- vanadium dioxide --- interface traps --- potential drop width (PDW) --- pattern recognition --- drain-induced barrier lowering (DIBL) --- atomic layer deposition (ALD) --- normally off power devices --- gate-induced drain leakage (GIDL) --- insulator–metal transition (IMT) --- zinc oxide --- synaptic device --- subthreshold slope (SS) --- landing --- silicon --- corner-effect --- conditioned reflex --- quantum dot --- gallium nitride --- bismuth ions --- conduction band offset --- variational form --- Green's function --- insulator-metal transition (IMT)


Book
Wide Bandgap Based Devices: Design, Fabrication and Applications, Volume II
Author:
Year: 2022 Publisher: Basel MDPI - Multidisciplinary Digital Publishing Institute

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Abstract

Wide bandgap (WBG) semiconductors are becoming a key enabling technology for several strategic fields, including power electronics, illumination, and sensors. This reprint collects the 23 papers covering the full spectrum of the above applications and providing contributions from the on-going research at different levels, from materials to devices and from circuits to systems.

Keywords

energy storage system --- power conditioning system --- silicon carbide --- vanadium redox flow batteries --- AlGaN/GaN --- SiC --- high electron mobility transistor --- Schottky barrier diode --- breakdown field --- noise --- charge traps --- radio frequency --- wide-bandgap (WBG) --- gallium nitride (GaN) --- silicon carbide (SiC) --- high electron mobility transistor (HEMT) --- metal-oxide-semiconductor field effect transistor (MOSFET) --- driving technology --- nickel oxide --- annealing temperature --- crystallite size --- optical band gap --- electrochromic device --- indium oxide thin film --- solution method --- plasma surface treatment --- bias stability --- aluminum nitride --- Schottky barrier diodes --- radio frequency sputtering --- X-ray diffraction --- X-ray photoelectron spectroscopy --- piezoelectric micromachined ultrasonic transducers --- ranging --- time of flight (TOF) --- time to digital converter circuit (TDC) --- AlGaN/GaN heterojunction --- p-GaN gate --- unidirectional operation --- rectifying electrode --- first-principles --- density functional theory --- pure β-Ga2O3 --- Sr-doped β-Ga2O3 --- p-type doping --- band structure --- density of states --- optical absorption --- AlN buffer layer --- NH3 growth interruption --- strain relaxation --- GaN-based LED --- low defect density --- gate bias modulation --- palladium catalyst --- gallium nitride --- nitrogen dioxide gas sensor --- laser micromachining --- sapphire --- AlGaN/GaN heterostructures --- high-electron mobility devices --- p-GaN gate HEMT --- normally off --- low-resistance SiC substrate --- temperature --- high electron-mobility transistor (HEMT) --- equivalent-circuit modeling --- microwave frequency --- scattering-parameter measurements --- GaN --- MIS-HEMTs --- fabrication --- threshold voltage stability --- supercritical technology --- GaN power HEMTs --- breakdown voltage --- current collapse --- compensation ratio --- auto-compensation --- carbon doping --- HVPE --- AlN --- high-temperature --- buffer layer --- nitridation --- high-electron mobility transistor --- heterogeneous integration --- SOI --- QST --- crystal growth --- cubic and hexagonal structure --- blue and yellow luminescence --- electron lifetime --- wafer dicing --- stealth dicing --- laser thermal separation --- dry processing --- laser processing --- wide bandgap semiconductor --- photovoltaic module --- digital signal processor --- synchronous buck converter --- polar --- semi-polar --- non-polar --- magnetron sputtering --- HTA --- GaN-HEMT mesa structures --- 2DEG --- X-ray sensor --- X-ray imaging --- n/a

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