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This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students.
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Radiology --- X-rays --- Radiology.
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Ce livre a pour objectif d’apporter une initiation à la technique de résolution de structure par cristallographie aux rayons X aux étudiants en chimie. Il n’a pas été conçu comme un manuel pratique pour les chercheurs du domaine. L’approche choisie est d’introduire les principes et les concepts fondamentaux, de montrer comment ils sont utilisés en pratique, et ensuite d’illustrer avec des cas concrets dans des études. Quelques sujets relatifs à la cristallographie sont discutés dans le dernier chapitre. « … une initiation à la technique de résolution de structure par cristallographie aux rayons X »
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Radiology --- X-rays --- Radiology.
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Today many radiographers are trained to report on trauma radiographs. Universities are also training student radiographers to comment on trauma radiographs. It is useful, in some cases essential, that whilst we review the trauma radiograph we also recognise and note any appropriate pathology. For instance a patient attends Accident and Emergency with pain in their knee for several weeks following trauma; the radiographs show no fracture but some signs of a malignant bony tumour, which on further investigation is an osteo sarcoma. As with the other books in the series, this book starts with sev
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This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
X-rays --- Diffraction --- Diffraction. --- Rayons X
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This book illustrates a few exemplary scientific topics addressed through the use of two complementary x-ray scattering techniques: inelastic x-ray scattering and x-ray powder diffraction. These scattering methods are the focus of the two main sections of this book. These sections are subdivided into chapters discussing specific applications. The general aim of this volume is providing a concise overview of the opportunities disclosed by these two experimental methods, providing some guidance for scientists picking up this field and, hopefully, inspiring more mature scientists towards the achievement of new advances in this area.
X-ray crystallography. --- X-rays --- Diffraction.
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Oxide-based electronics have been well established as an alternative to silicon technology; however, typical processing requires complex, high-vacuum equipment, which is a major drawback, particularly when targeting low-cost applications. The possibility to deposit the materials by low-cost techniques such as inkjet printing has drawn tremendous interest in solution processible materials for electronic applications; however, high processing temperatures still required. To overcome this issue, solution combustion synthesis has been recently pursued. Taking advantage of the exothermic nature of the reaction as a source of energy for localized heating, the precursor solutions can be converted into oxides at lower process temperatures. Theoretically, this can be applied to any metal ions to produce the desired oxide, opening unlimited possibilities to materials' composition and combinations. Solution combustion synthesis has been applied for the production of semiconductor thin films based on ZnO, In2O3, SnO2 and combinations of these oxides, and also for high κ dielectrics (Al2O3). All of which are required for numerous electronic devices and applications such as fully oxide-based thin-film transistors (TFTs). The properties of produced thin films are highly dependent on the precursor solution characteristics; hence, the influence of several processing parameters; organic fuel, solvent and annealing temperature was studied. Although precursor solution degradation/oxide formation mechanisms are not yet fully understood, particularly for thin films, we demonstrate that high-performance devices are obtained with combustion solution-based metal oxide thin films. The results clearly show that solution combustion synthesis is becoming one of the most promising methods for low-temperature flexible electronics.
Chemical engineering. --- Dielectrics. --- Biological systems. --- X-rays.
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Collection of Simulated XRD Powder Patterns for Zeolites serves as a source of reference patterns for pure zeolite phases. The data will be helpful in establishing the structural purity of experimental phases and in indexing their diffraction patterns. The information will also aid in the determination of changes in the lattice parameters with changing composition, assessing preferred orientation effects, background evaluation, and line broadening. Also included are diffraction patterns of several common dense silicate phases to facilitate their detection in mixed phase synthesis.
X-rays --- Zeolites --- Diffraction --- Analysis --- Silicate minerals --- Analysis. --- Diffraction. --- X-rays - Diffraction --- Zeolites - Analysis
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A complete account of the theory of the diffraction of X-rays by crystals, with particular reference to the processes of determining the structures of protein molecules. This book is aimed primarily at structural biologists and biochemists but will also be valuable to those entering the field with a background in physical sciences or chemistry. It may be used at any post-school level, and develops from first principles all relevant mathematics, diffraction and wave theory, assuming no mathematical knowledge beyond integral calculus. The book covers a host of important topics in the area, including: * The practical aspects of sample preparation and X-ray data collection, using both laboratory and synchrotron sources * Data analysis at both theoretical and practical levels * The important role played by the Patterson function in structure analysis, by both molecular replacement and experimental phasing approaches * Methods for improving the resulting electron density map* The theoretical basis of methods used in refinement of protein crystal structures * In-depth explanation of the crucial task of defining the binding sites of ligands and drug molecules * The complementary roles of other diffraction methods: these reveal further detail of great functional importance in a crystal structure.
Chemical and physical crystallography --- fysicochemie --- X-Rays --- Proteins --- Science --- X-rays
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