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Polymer Microscopy, Third Edition, is a comprehensive and practical guide to the study of the microstructure of polymers, and is the result of the authors' many years of academic and industrial experience. To address the needs of students and professionals from a variety of backgrounds, introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization. Microscopy is applied to the characterization of a wide range of polymer systems, including fibers, films, engineering resins and plastics, composites, nanocomposites, polymer blends, emulsions and liquid crystalline polymers. Light microscopy, atomic force microscopy, and scanning and transmission electron microscopy techniques are all considered, as are emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy. This extensively updated and revised new edition closes with a problem solving guide, which provides a systematic framework for deciding on suitable approaches to the characterization of polymer microstructure.

Polymers --- Polymères --- Optical properties. --- Surfaces. --- Microscopy. --- Propriétés optiques. --- Microscopie. --- Polymere --- Polymeride --- Polymers and polymerization --- Macromolecules --- Chemical engineering. --- Surfaces (Physics). --- Polymers. --- Industrial Chemistry/Chemical Engineering. --- Characterization and Evaluation of Materials. --- Polymer Sciences. --- Physics --- Surface chemistry --- Surfaces (Technology) --- Chemistry, Industrial --- Engineering, Chemical --- Industrial chemistry --- Engineering --- Chemistry, Technical --- Metallurgy --- Materials science. --- Polymers  . --- Material science --- Physical sciences --- Polymeres --- Proprietes optiques.

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This new edition provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though fifteen give essential theoretical background, while chapters sixteen through twenty-five guide the reader through practical aspects of extracting structural information from powder data. Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition is suited for undergraduate and graduate students and practitioners from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution using the powder diffraction method. Key features of the second edition: The book requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. While developed as a text to teach students, the book is also a reference for academic and industrial researchers using the powder diffraction method in their daily work. Major revisions include expanded treatment of non-crystallographic symmetry brief introductions to the total scattering analysis and non-ambient powder diffractometry basics of quantitative analysis using the Rietveld method, including determination of amorphous content addition of a difficult pseudo-symmetric indexing case expanded coverage of direct space structure solution techniques an introduction to the mechanism of constraints, restraints and rigid bodies and a new example of structure solution of a pharmaceutical compound additional problems to help in assessment of students’ progress. The book is supplemented by online content, including color figures, powder diffraction data, examples, and web links.

materiaalkennis --- Chemical structure --- fysicochemie --- Materials sciences --- Chemical and physical cristallography --- atoomstructuur --- Physicochemistry --- Solid state physics --- fysica --- kristallografie --- Powders --- X-rays --- X-ray crystallography --- Poudres --- Rayons X --- Radiocristallographie --- Optical properties --- Measurement --- Diffraction --- Propriétés optiques --- Mesure --- EPUB-LIV-FT LIVCHIMI SPRINGER-B --- Chemistry, Physical organic. --- Surfaces (Physics). --- Crystallography. --- Physical Chemistry. --- Characterization and Evaluation of Materials. --- Crystallography and Scattering Methods. --- Atomic/Molecular Structure and Spectra. --- Condensed Matter Physics. --- Leptology --- Physical sciences --- Mineralogy --- Physics --- Surface chemistry --- Surfaces (Technology) --- Chemistry, Physical organic --- Chemistry, Organic --- Chemistry, Physical and theoretical --- Measurement. --- Physical chemistry. --- Materials science. --- Atomic structure  . --- Molecular structure . --- Condensed matter. --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids --- Structure, Molecular --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Material science --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry --- Chemistry --- Powders - Optical properties - Measurement --- X-rays - Diffraction - Measurement --- Chemistry, Physical and theoretical. --- Atomic structure. --- Molecular structure.