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The first book on the topic, and written by the founder of the technique, this comprehensive resource provides a detailed overview of sum-frequency spectroscopy, its fundamental principles, and the wide range of applications for surfaces, interfaces, and bulk. Beginning with an overview of the historical context, and introductions to the basic theory of nonlinear optics and surface sum-frequency generation, topics covered include discussion of different experimental arrangements adopted by researchers, notes on proper data analysis, an up-to-date survey commenting on the wide range of successful applications of the tool, and a valuable insight into current unsolved problems and potential areas to be explored in the future. With the addition of chapter appendices that offer the opportunity for more in-depth theoretical discussion, this is an essential resource that integrates all aspects of the subject and is ideal for anyone using, or interested in using, sum-frequency spectroscopy.

Laser spectroscopy. --- Nonlinear optics. --- Nonlinear optical spectroscopy. --- Second harmonic generation. --- Surface chemistry. --- Chemistry, Surface --- Interfaces, Chemistry of --- Surface phenomena --- Surfaces (Chemistry) --- Chemistry, Physical and theoretical --- Capillarity --- Surface energy --- Surface tension --- Surfaces (Physics) --- Optical second harmonic generation --- SHG (Second harmonic generation) --- Nonlinear optics --- Spectrum analysis --- Optics, Nonlinear --- Optics --- Lasers

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Sight is the dominant sense of mankind to apprehend the world at the earth scale and beyond the frontiers of the infinite, from the nanometer to the incommensurable. Primarily based on sunlight and natural and artificial light sources, optics has been the major companion of spectroscopy since scientific observation began. The invention of the laser in the early sixties has boosted optical spectroscopy through the intrinsic or specific symmetry electronic properties of materials at the multiscale (birefringence, nonlinear and photonic crystals), revealed by the ability to monitor light polarization inside or on the surface of designed objects. This Special Issue of Symmetry features articles and reviews that are of tremendous interest to scientists who study linear and nonlinear optics, all oriented around the common axis of symmetry. Contributions transverse the entire breadth of this field, including those concerning polarization and anisotropy within colloids of chromophores and metal/semiconducting nanoparticles probed by UV-visible and fluorescence spectroscopies; microscopic structures of liquid–liquid, liquid–gas, and liquid–solid interfaces; surface- and symmetry-specific optical techniques and simulations, including second-harmonic and sum-frequency generations, and surface-enhanced and coherent anti-Stokes Raman spectroscopies; orientation and chirality of bio-molecular interfaces; symmetry breaking in photochemistry; symmetric multipolar molecules; reversible electronic energy transfer within supramolecular systems; plasmonics; and light polarization effects in materials.

symmetry breaking --- chiral plasmonics --- non-linear optics --- plasmonic devices --- plasmonic sensing --- plasmonics --- LSPR scattering --- polarisation manipulation --- metamaterials --- Faraday effect (rotation) --- magneto-optic Kerr effect (MOKE) --- magnetoplasmonics --- molecular orientation --- spectral unmixing --- infrared absorption --- visible-infrared sum-frequency generation --- Raman scattering --- linear programming --- centrosymmetry --- spectroscopy --- selection rules --- infrared --- Raman --- sum-frequency generation --- interfaces --- molecules --- nanoparticles --- molecular aggregates --- second harmonic generation --- hyper rayleigh scattering --- second harmonic scattering --- light polarizatio --- quantum dots --- phenyl derivative --- UV–Visible spectroscopy --- sum-frequency generation spectroscopy --- dipole–dipole interaction --- polyoxometalates --- donor/acceptor substituents --- first hyperpolarizability --- (time-dependent) DFT --- n/a --- UV-Visible spectroscopy --- dipole-dipole interaction

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The open access journal Micromachines invites manuscript submissions for the Special Issue “Silicon Photonics Bloom”. The past two decades have witnessed a tremendous growth of silicon photonics. Lab-scale research on simple passive component designs is now being expanded by on-chip hybrid systems architectures. With the recent injection of government and private funding, we are living the 1980s of the electronic industry, when the first merchant foundries were established. Soon, we will see more and more merchant foundries proposing well-established electronic design tools, product development kits, and mature component libraries. The open access journal Micromachines invites the submission of manuscripts in the developing area of silicon photonics. The goal of this Special Issue is to highlight the recent developments in this cutting-edge technology.]

quantum dot --- silicon nanocrystals --- light emitting diode --- vertical grating coupler --- WDM transmitter --- optical interconnects --- silicon photonics --- silicon optical modulator --- Silicon Photonics --- off-chip coupling --- polarisation controller --- integrated polarimeter --- polarisation multiplexing --- polarisation shift keying --- germanium --- integrated optics --- optoelectronics --- photoconductivity --- terahertz --- frequency combs --- heterogeneous integration --- second-harmonic generation --- supercontinuum --- integrated photonics --- mode-locked lasers --- nonlinear optics --- microelectromechanical systems (MEMS) --- electrostatic actuator --- parallel plate actuation --- optical switch --- silicon-on-insulator (SOI) --- micro-platform --- optical waveguide --- silicon nitride photonics --- phase change material --- integrated silicon photonic circuits --- nanophononics --- modulator --- multimode interferometer --- photonics integrated circuit --- carrier plasma --- Mach–Zehnder interferometers --- silicon oxynitride --- thin film --- photoluminescence --- chemical vapor deposition --- physical vapor deposition --- dispersion control --- Bragg gratings --- photonic processors --- unitary transformation --- amorphous silicon oxycarbide --- nitrogen doping --- defect --- plasma enhanced chemical vapor deposition --- n/a --- Mach-Zehnder interferometers

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Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows: Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers. Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements. Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement. Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.

white light interference --- laser interference --- surface positioning --- end-plate surface distance measurement --- spherical diamond wheel --- diamond roller --- form truing --- in-situ measurements --- topography measurement --- differential measurement system --- modular design --- confocal sensor --- film interferometry --- over-constrained mechanism --- geometric deviations --- multi-tasking machine tools --- identification method --- squareness of translational axes --- metrology --- step gauge --- length calibration --- multi-path laser synthesis technology --- measurement mechanism --- machine tool --- surface shape contour --- on-site measurement --- positional relation --- scanless 3D imaging --- compressed sensing --- depth detection --- single-pixel detector --- blade tip timing --- circumferential Fourier fit --- synchronous vibration --- optical angle sensor --- mode-locked femtosecond laser --- optical frequency comb --- laser autocollimation --- diffraction grating --- absolute angle measurement --- nonlinear optics --- second harmonic generation --- aeroengine blade --- blade twist --- measurement and evaluation --- a priori planning --- geometric analysis --- automated optical inspection --- precision measurement --- circular contour --- edge detection --- measurement system analysis --- coordinate measuring machine --- reproducibility --- GD&amp --- T --- quality --- measurement uncertainty --- precision metrology --- form measurement --- stitching linear-scan method --- roundness measurement --- Monte Carlo method --- single point diamond tool --- cutting edge radius --- reversal method --- nanoindentation system --- elastic recovery --- surface charge distribution --- point probing characteristics --- spherical scattering electrical field probe --- miniature internal structures --- high aspect ratios --- circulating cooling water --- dynamic thermal filtering --- precision manufacturing --- quick response --- temperature stability --- thermal management --- dual-axis level --- light refraction --- light transmission --- angle measurement --- differential Fabry–Pérot interferometer --- homodyne interferometer --- nonlinearity error --- linear displacement --- chromatic confocal probe --- femtosecond laser --- off-axis differential method --- tracking local minimum method --- laser triangulation displacement sensor (LTDS) --- dispensing robot --- location system --- actual laser imaging waveform --- centroid difference --- repeatability accuracy --- dynamic response speed --- absolute distance measurement --- system error correction --- surface texture measurement --- confocal sensing --- surface form tracing --- 3D reconstruction --- roughness --- in-process --- metrology for machining --- optical coherence tomography --- wafer die --- defect detection --- generative adversarial network (GAN) --- you only look once version 3 (YOLOv3) --- pad dressing --- dynamic measurement --- CMP --- pad uniformity --- pad lifetime --- n/a --- differential Fabry-Pérot interferometer