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Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking. The research advances of innovative nano-scale devices have created great opportunities to surpass the barriers faced by CMOS technology, which include nanowires, carbon nanotube transistors, programmable molecular switches, resonant tunneling diodes, quantum dots, etc. However, the success of many nanotechnologies relies on the self-assembly fabrication process to fabricate circuits. The stochastic self-assembly fabrication, unfortunately, has low reliability with defect densities several orders of magnitude higher than conventional CMOS technology. Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.
Electronic digital computers -- Circuits. --- Nanoelectronics. --- Electronic digital computers --- Nanoelectronics --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Computer Science --- Electrical Engineering --- Circuits --- High performance computing. --- Nanotechnology. --- Molecular technology --- Nanoscale technology --- HPC (Computer science) --- High technology --- Electronic data processing --- Cyberinfrastructure --- Supercomputers
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Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading. The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009.
Electronic digital computers -- Circuits -- Testing. --- Integrated circuits -- Computer simulation. --- Integrated circuits -- Verification. --- Electronic digital computers --- Integrated circuits --- Engineering & Applied Sciences --- Electrical & Computer Engineering --- Computer Science --- Electrical Engineering --- Circuits --- Testing --- Verification --- Computer simulation --- Computer software --- Computers --- Electric fault location. --- Testing. --- Very large scale integration --- Computer-aided design. --- Landrault, Christian. --- Fault location (Electrical engineering) --- Automatic computers --- Automatic data processors --- Computer hardware --- Computing machines (Computers) --- Electronic brains --- Electronic calculating-machines --- Electronic computers --- Hardware, Computer --- Software, Computer --- Computer science. --- Computer hardware. --- Computer logic. --- Computer simulation. --- Electronic circuits. --- Computer Science. --- Computer Hardware. --- Logics and Meanings of Programs. --- Simulation and Modeling. --- Circuits and Systems. --- Performance and Reliability. --- Reusability. --- Electric circuits --- Electric currents --- Fault location (Engineering) --- Short circuits --- Computer systems --- Cybernetics --- Machine theory --- Calculators --- Cyberspace --- Logic design. --- Systems engineering. --- Operating systems (Computers). --- Computer operating systems --- Disk operating systems --- Systems software --- Engineering systems --- System engineering --- Engineering --- Industrial engineering --- System analysis --- Computer modeling --- Computer models --- Modeling, Computer --- Models, Computer --- Simulation, Computer --- Electromechanical analogies --- Mathematical models --- Simulation methods --- Model-integrated computing --- Design, Logic --- Design of logic systems --- Digital electronics --- Electronic circuit design --- Logic circuits --- Switching theory --- Operating systems --- Design and construction --- Computer software—Reusability. --- Electron-tube circuits --- Electron tubes --- Electronics --- Computer science logic --- Logic, Symbolic and mathematical
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