Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.

Electron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Emission

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and

X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

The second edition of Internal Photoemission Spectroscopy thoroughly updates this vital, practical guide to internal photoemission (IPE) phenomena and measurements. The book's discussion of fundamental physical and technical aspects of IPE spectroscopic applications is supplemented by an extended overview of recent experimental results in swiftly advancing research fields. These include the development of insulating materials for advanced SiMOS technology, metal gate materials, development of heterostructures based on high-mobility semiconductors, and more. Recent results concerning

Photoelectron spectroscopy. --- Photoemission. --- Semiconductors -- Junctions. --- Photoelectron spectroscopy --- Photoemission --- Semiconductors --- Chemistry --- Physics --- Physical Sciences & Mathematics --- Analytical Chemistry --- Light & Optics --- Junctions --- Junctions. --- Emission, Photoelectric --- External photoelectric effect --- Photoelectric effect, External --- Photoelectric emission --- Electrons --- Photoelectricity --- Junctions, Semiconductor --- Semiconductor interface --- Semiconductor interfaces --- Semiconductor junctions --- Interfaces (Physical sciences) --- Spectroscopy, Photoelectron --- Electron spectroscopy --- Molecular orbitals --- Molecular spectra --- Molecular spectroscopy --- Spectrum analysis --- Emission --- Interfaces

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

The interaction of ionising radiation with atomic and/or molecular ions is a fundamental process in nature, with implications for the understanding of many laboratory and astrophysical plasmas. At short wavelengths, the photon–ion interactions lead to inner-shell and multiple electron excitations, leading to demands on appropriate laboratory developments of sources and detectors and requiring advanced theoretical treatments which take into account many-body electron-correlation effects. This book includes a range of papers based on different short wavelength photon sources including recent facility and instrumental developments. Topics include experimental photoabsorption studies with laser-produced plasmas and photoionization of atomic and molecular ions with synchrotron and FEL sources, including modifications of a cylindrical mirror analyzer for high efficiency photoelectron spectroscopy on ion beams. Theoretical investigations include the effects of FEL fluctuations on autoionization line shapes, multiple sequential ionization by intense fs XUV pulses, photoelectron angular distributions for non-resonant two-photon ionization, inner-shell photodetachment of Na- and spin-polarized fluxes from fullerene anions.

2s2p --- Lithium-ion --- auto-ionization --- free electron laser --- stochastic average --- time dependent density matrix --- photoionization --- multiple ionization --- many-electron processes --- absolute cross sections --- synchrotron radiation --- collisional-radiative model --- laser-produced plasma, ion distribution --- ionization bottleneck --- radiative recombination --- collisional ioniztion --- three-body recombination --- nonlinear photoionization --- nonlinear interaction --- Cooper minimum --- angular distributions --- atomic ions --- dual-laser plasma technique --- photodetachment --- inner-shell phenomena --- electron spectroscopy --- ion beam --- spin-polarization --- fullerene anions --- endohedral fullerene anions --- NH+ --- molecular ion --- K-shell --- merged-beam --- Pb-Sn alloys --- EUV emission of high Z materials --- collisional radiative model --- Cowan suite of Codes --- ions --- free-electron laser --- krypton --- femtosecond pulses --- photoelectron spectroscopy --- atomic data --- inner-shell photoionization --- atomic nitrogen ion --- n/a

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Electrochemical surface science (EC-SS) is the natural advancement of traditional surface science (where gas–vacuum/solid interfaces are studied) to liquid (solution)/electrified solid interfaces. Such a merging between two different disciplines—i.e., surface science (SS) and electrochemistry—officially advanced ca. three decades ago. The main characteristic of EC-SS versus electrochemistry is the reductionist approach undertaken, inherited from SS and aiming to understand the microscopic processes occurring at electrodes on the atomic level. A few of the exemplary keystone tools of EC-SS include EC-scanning probe microscopies, operando and in situ spectroscopies and electron microscopies, and differential EC mass spectrometry (DEMS). EC-SS indirectly (and often unconsciously) receives a great boost from the requirement for rational design of energy conversion and storage devices for the next generation of energetic landscapes. As a matter of fact, the number of material science groups deeply involved in such a challenging field has tremendously expanded and, within such a panorama, EC and SS investigations are intimately combined in a huge number of papers. The aim of this Special Issue is to offer an open access forum where researchers in the field of electrochemistry, surface science, and materials science could outline the great advances that can be reached by exploiting EC-SS approaches. Papers addressing both the basic science and more applied issues in the field of EC-SS and energy conversion and storage materials have been published in this Special Issue.

Pd thin films --- n/a --- Auger-Electron Spectroscopy --- benchmarking --- potential-dependent structures --- CO electro-oxidation --- surface reconstruction --- photo-electrochemistry --- nitrogen doping --- potential stepping --- DFT --- nanoparticles --- carbon nanofiber --- Pd --- gas diffusion electrode --- flexible ITO --- UPS --- palladium --- Lead OPD --- formic acid oxidation --- cobalt oxide --- adsorbed OH --- electrochemistry --- Pt --- mesopore --- DMFC --- pH and concentration effects --- solvothermal method --- direct methanol fuel cells --- EF-PEEM --- PVDF --- self-assembly --- PEMFC --- hard X rays --- photochemistry --- EQCM --- potential cycling --- surface alloy --- near ambient pressure XPS --- cobalt-based electrocatalyst --- silver single crystals --- Cu(111) --- electrodeposited alloys --- Pt single-crystal electrodes --- SOFC --- TiO2 --- oxygen evolution reaction --- silicon nanoparticles --- pump &amp --- graphitization --- in situ EC-STM --- oxygen reduction --- gold --- diazonium salts --- Au --- micropore --- solid/liquid interface --- XPS --- XAFS --- surface chemistry --- electrosynthesis --- porous fiber --- surface science --- click chemistry --- adhesion --- in situ --- methanol oxidation reaction --- hydroxyl radical --- mass transport --- free electron laser --- cyclic voltammetry --- redox properties --- electro-oxidation --- X-ray absorption spectroscopy --- hydrogen adsorption --- electrodeposition --- electrocatalysis --- Ordered mesoporous carbon --- Corrosion Protection --- electrochemical interface --- cyclic voltammetry (CV) --- FEXRAV --- photoelectron simulations --- Pt–Ru catalysts --- d-band theory --- bimetallic alloy --- photoconversion --- ordered mesoporous carbons --- carbon nanofibers (CNFs) --- platinum --- water splitting --- Surface Modification --- EPR spectroscopy --- scanning photoelectron microscopy --- model catalyst --- energy dispersive --- porphyrins --- combined non-covalent control --- AES --- spin-coating --- SAMs --- water oxidation --- in-situ X-ray diffraction --- Au nanocrystals --- model systems --- platinum single crystals --- cathode --- redox monolayers --- surface nanostructures --- bifunctional oxygen electrode --- polymer --- photoelectrochemistry --- metal-electrolyte interface --- electrocatalysts --- APTES --- porogen --- electrophoretic deposition --- thin-films --- ammonia activation --- graphene --- ORR --- polypyrrole --- iridium --- surface area --- reduced graphene oxide --- Magnetite --- Platinum --- electrospinning --- catalysts --- Blackening of Steel --- switchable surfaces --- in situ ambient pressure XPS --- fuel cells --- methanol oxidation --- quick-XAS --- nickel --- CO oxidation --- solid oxide fuel cells --- operando --- probe --- CdS --- alkanthiols --- ECALE --- alkoxyamine surfaces --- underpotential deposition (upd) --- Pt-Ru catalysts