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FTCS 16th Annual international symposium on fault-tolerant computing systems : Vienna, Austria, 1-4 July, 1986. Digest of papers
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ISBN: 0818607033 9780818607035 Year: 1986 Publisher: Washington (D.C.): IEEE computer society press


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FTCS 17 : fault-tolerant computing symposium, July 6-8, 1987, Sheraton Station Square, Pittsburgh, Pennsylvania, USA. Digest of papers
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ISBN: 0818607785 9780818607783 Year: 1987 Publisher: Washington (D.C.): IEEE computer society press

Accelerated quality and reliability solutions
Authors: ---
ISBN: 128063782X 9786610637829 0080459595 0080449247 9780080459592 9780080449241 Year: 2006 Publisher: Amsterdam : Elsevier,

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Drawing of real-world issues and with supporting data from industry, this book overviews the technique and equipment available to engineers and scientists to identify the solutions of the physical essence of engineering problems in simulation, accelerated testing, prediction, quality improvement, and risk during the design, manufacturing, and maintenance stages. For this goal the book integrates Quality Improvement and Accelerated Reliability/ Durability/ Maintainability/Test Engineering concepts. The book includes new and unpublished aspects in quality: - complex analysis of factors that infl


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Trends in development of accelerated testing for automotive and aerospace engineering
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ISBN: 0128188413 9780128188422 0128188421 9780128188415 Year: 2020 Publisher: Amsterdam : Academic Press,

Accelerated testing: statistical models, test plans, and data analysis
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ISBN: 0471522775 Year: 1990 Publisher: New York Wiley

Error detecting codes, self-checking circuits and applications
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ISBN: 0444002561 Year: 1978 Publisher: New York (N.Y.): North-Holland

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Keywords

Automatic checkout equipment --- Electronic digital computers --- -Error-correcting codes (Information theory) --- 681.3*B13 --- 681.3*B45 --- 681.3*B53 --- 681.3*E4 --- Codes, Error-correcting (Information theory) --- Error-detecting codes (Information theory) --- Forbidden-combination check (Information theory) --- Self-checking codes (Information theory) --- Artificial intelligence --- Automatic control --- Coding theory --- Information theory --- Automatic digital computers --- Computers, Electronic digital --- Digital computers, Electronic --- Computers --- Hybrid computers --- Sequential machine theory --- ACE (Automatic checkout equipment) --- ATE (Automatic test equipment) --- Built-in test equipment --- Electronic instruments --- Nondestructive testing --- Design and construction --- Control structure reliability, testing and fault-tolerance: diagnostics, error-checking, redundant design, test generation --- Reliability, testing and fault-tolerance: built-in tests; diagnostics; error-checking; redundant design; test generation (Input/output and data communications --- Reliability and testing: built-in tests; error-checking; redundant design; test generation; testability (Register-transfer-level implementation) --- Coding and information theory: data compaction and compression; formal modelsof communication; nonsecret encoding schemes--See also {681.3*H11} --- Equipment and supplies --- Automatic test equipment. --- Error-correcting codes (Information theory) --- Design and construction. --- Error-correcting codes (Information theory). --- 681.3*E4 Coding and information theory: data compaction and compression; formal modelsof communication; nonsecret encoding schemes--See also {681.3*H11} --- 681.3*B53 Reliability and testing: built-in tests; error-checking; redundant design; test generation; testability (Register-transfer-level implementation) --- 681.3*B45 Reliability, testing and fault-tolerance: built-in tests; diagnostics; error-checking; redundant design; test generation (Input/output and data communications --- 681.3*B13 Control structure reliability, testing and fault-tolerance: diagnostics, error-checking, redundant design, test generation


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Accelerated testing and validation
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ISBN: 128102015X 9786611020156 0080488072 1417537132 0750676531 9781417537136 159278285X 9781592782857 9780080488073 9780750676533 6611020152 Year: 2004 Publisher: Amsterdam Boston, Mass. Newnes

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Accelerated Testing and Validation Methods is a cross-disciplinary guide that describes testing and validation tools and techniques throughout the product development process. Alex Porter not only focuses on what information is needed but also on what tools can produce the information in a timely manner. From the information provided, engineers and managers can determine what data is needed from a test and validation program and then how to select the best, most effective methods for obtaining the data.This book integrates testing and validation methods with a business perspective so r


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Advances in degradation modeling : applications to reliability, survival analysis, and finance
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ISBN: 0817649239 9786612927928 1282927922 0817649247 Year: 2009 Publisher: Boston : Birkhauser,

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This volume—dedicated to William Q. Meeker on the occasion of his sixtieth birthday—is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics, and finance. Specific topics covered include: * Accelerated testing and inference * Step-stress testing and inference * Nonparametric inference * Model validity in accelerated testing * The point process approach * Bootstrap methods in degradation analysis * Exact inferential methods in reliability * Dynamic perturbed systems * Degradation models in statistics Advances in Degradation Modeling is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.

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