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Book
IEC 62860 : 2013(E) IEEE Std 1620-2008 : Test methods for the characterization of organic transistors and materials
Author:
ISBN: 0738186856 Year: 2013 Publisher: Piscataway, New Jersey : IEEE,

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Abstract

Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor.

Keywords

Transistors.


Book
IEEE Std 218-1956 (Reaffirmed 1980, 56 IRE 28.S2) : IEEE standard methods of testing transistors
Author:
ISBN: 150440209X Year: 1956 Publisher: Piscataway, New Jersey : IEEE,

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Abstract

This standard deals with the methods of measurement of important characteristics of transistors. In general, these characteristics are referred to as parameters of the devices. Because of the youthfulness of the transistor art, methods of testing transistors will continue to change considerably before the art can be considered to have "stabilized" sufficiently for complete standardization. This standard corresponds to the current state of transistor testing methods, and its publication by the IRE is considered preferable to waiting for a future stabilization of the many rapid changes now characteristic of this field.

Keywords

Transistors.


Book
Propriétés et applications des transistors.
Author:
Year: 1958 Publisher: Paris Société française de documentation électronique

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Keywords

Transistors


Book
Transistorschaltungen für die Modellfernsteuerung
Author:
Year: 1965 Publisher: München Franzis

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Keywords

Transistors

The bipolar junction transistor.
Author:
ISBN: 0201053225 Year: 1983 Publisher: Reading (Mass.) Addison-Wesley

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Book
IEEE Standard for Uncontrolled Traction Power Rectifiers for Substation Applications Up to 1500 V DC Nominal Output
Author:
ISBN: 0738161225 0738161217 Year: 2010 Publisher: New York : Institute of Electrical and Electronics Engineers,

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Abstract

The design, manufacturing, and testing unique to the application of uncontrolled semiconductor power rectifiers for direct current (dc) supplied transportation substation applications up to 1500 V dc nominal output is covered in this standard. The standard is intended to address traction power substation rectifiers that are to be provided as part of a rectifier transformer unit or are provided separately. Application information and extensive definitions of related technical terms are included. Keywords: commutating reactance, double-way, extra heavy traction, heavy traction, interphase transformer, light transition load, power rectifier, rectifier transformer unit, service rating, traction power substation.


Book
IEEE Std C57.125-1991 : IEEE Guide for Failure Investigation, Documentation, and Analysis for Power Transformers and Shunt Reactors
Author:
ISBN: 073819901X 0738114189 Year: 2015 Publisher: Piscataway, NJ : IEEE,

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Abstract

A procedure to be used to perform a failure analysis is recommended. The procedure is primarily focused on power transformers used on electric utility systems, although it may be used for an investigation into any ac transformer failure. This document provides a methodology by which the most probable cause of any particular transformer failure may be determined. This document is also intended to encourage the establishment of routine and uniform data collection procedures, consistency of nomenclature and compatibility with similar efforts by other organizations, and cooperative efforts by users and manufacturers during the failure analysis.


Book
IEEE Guide for Liquid-Immersed Transformers Through-Fault-Current Duration
Author:
ISBN: 0738108405 Year: 1993 Publisher: New York : Institute of Electrical and Electronics Engineers (IEEE),

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Abstract

Recommendations believed essential for the application of over current protective devices applied to limit the exposure time of transformers to short-circuit current are set forth. Transformer coordination curves are presented for four categories of transformers. There is no intent to imply overload capability.


Book
IEEE Guide for Partial Discharge Measurement in Liquid- Filled Power Transformers and Shunt Reactors
Author:
ISBN: 073810843X Year: 1991 Publisher: New York : Institute of Electrical and Electronics Engineers (IEEE),

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Institute of Electrical and Electronics Engineers (IEEE).


Book
IEEE Std C57.120-1991 : IEEE Loss Evaluation Guide for Power Transformers and Reactors
Author:
ISBN: 0738127094 Year: 1992 Publisher: New York : IEEE,

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Abstract

In this standard a method for establishing the dollar value of the electric power needed to supply the losses of a transformer or reactor is provided. Users can use this loss evaluation to determine the relative economic benefit of a high-first-cost, low-loss unit versus one with a lower first cost and higher losses, and to compare the offerings of two or more manufacturers to aid in making the best purchase choice. Manufacturers can use the evaluation to optimize the design and provide the most economical unit to bid and manufacture. The various types of losses are reviewed.

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