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53.08 <063> --- Manufacturing processes --- -Mensuration --- -Nanotechnology --- -Molecular technology --- Nanoscale technology --- High technology --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Industrial processing --- Manufacture --- Process engineering (Manufactures) --- Processes, Manufacturing --- Processing, Industrial --- Production processes --- Industrial arts --- Production engineering --- Machine-tools --- Materials --- 53.08 <063> General principles and theory of measurement and the design of measuring apparatus. Measurement methods--Congressen --- General principles and theory of measurement and the design of measuring apparatus. Measurement methods--Congressen --- Congresses --- -General principles and theory of measurement and the design of measuring apparatus. Measurement methods--Congressen --- Measurement --- Nanotechnology --- Nanotechnology - Congresses. --- Manufacturing processes - Congresses. --- Measurement - Congresses.

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Scanning probe microscopy --- Scanned probe microscopy --- Scanning electron microscopy --- Spectroscopy. --- Microscopy. --- Materials—Surfaces. --- Thin films. --- Physical measurements. --- Measurement   . --- Solid state physics. --- Condensed matter. --- Nanotechnology. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Measurement Science and Instrumentation. --- Solid State Physics. --- Condensed Matter Physics. --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids --- Physics --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Films, Thin --- Solid film --- Solid state electronics --- Surfaces (Technology) --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Analytical chemistry --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Molecular technology --- Nanoscale technology --- High technology --- Qualitative