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Ellipsometry --- Spectrum analysis --- Materials --- Optical properties --- Ellipsométrie --- Ellipsométrie --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Engineering --- Engineering materials --- Industrial materials --- Engineering design --- Manufacturing processes --- Polarimetry --- Polarization (Light) --- Surfaces (Technology) --- Thin films --- Qualitative --- Analyse spectrale --- Spectrometry --- Analytical chemistry --- Materials - Optical properties

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Spectroscopie électronique --- Spectroscopie électronique --- Thin films --- Electron spectroscopy. --- Spectrum analysis. --- Electron spectroscopy --- Spectrum analysis --- Surfaces --- Analysis. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Electron spectroscopy for chemical analysis --- ESCA --- Electrons --- X-rays --- Surfaces&delete& --- Analysis --- Qualitative --- Emission --- Analyse spectrale --- Spectrometry --- Analytical chemistry --- Thin films - Surfaces - Analysis.

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It may be argued that silicon, carbon, hydrogen, oxygen, and iron are among the most important elements on our planet, because of their involvement in geological, biol- ical, and technological processes and phenomena. All of these elements have been studied exhaustively, and voluminous material is available on their properties. Included in this material are numerous accounts of their electrochemical properties, ranging from reviews to extensive monographs to encyclopedic discourses. This is certainly true for C, H, O, and Fe, but it is true to a much lesser extent for Si, except for the specific topic of semiconductor electrochemistry. Indeed, given the importance of the elect- chemical processing of silicon and the use of silicon in electrochemical devices (e. g. , sensors and photoelectrochemical cells), the lack of a comprehensive account of the electrochemistry of silicon in aqueous solution at the fundamental level is surprising and somewhat troubling. It is troubling in the sense that the non-photoelectrochemistry of silicon seems “to have fallen through the cracks,” with the result that some of the electrochemical properties of this element are not as well known as might be warranted by its importance in a modern technological society. Dr. Zhang’s book, Electrochemical Properties of Silicon and Its Oxide, will go a long way toward addressing this shortcoming. As with his earlier book on the elect- chemistry of zinc, the present book provides a comprehensive account of the elect- chemistry of silicon in aqueous solution.

Electrochemistry. --- Silicon compounds --- Semiconductors --- Electrochimie --- Electric properties. --- 546.28 --- 541.13 --- Silicon Si --- Electrochemistry --- Analytical biochemistry. --- Chemical engineering. --- Chemistry. --- Computer engineering. --- Semiconductors - Electric properties. --- Chemistry --- Physical Sciences & Mathematics --- Physical & Theoretical Chemistry --- Electric properties --- 541.13 Electrochemistry --- 546.28 Silicon Si --- Analytical chemistry. --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Electrical engineering. --- Analytical Chemistry. --- Electrical Engineering. --- Industrial Chemistry/Chemical Engineering. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Chemicals --- Crystalline semiconductors --- Semi-conductors --- Semiconducting materials --- Semiconductor devices --- Crystals --- Electrical engineering --- Electronics --- Solid state electronics --- Chemistry, Physical and theoretical --- Materials --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Physics --- Solids --- Chemistry, Industrial --- Engineering, Chemical --- Industrial chemistry --- Engineering --- Chemistry, Technical --- Metallurgy --- Electric engineering --- Analysis, Chemical --- Analytic chemistry --- Chemical analysis --- Qualitative --- Analytical chemistry

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Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Scanning probe microscopy --- Scanned probe microscopy --- Scanning electron microscopy --- Spectroscopy. --- Microscopy. --- Materials—Surfaces. --- Thin films. --- Physical measurements. --- Measurement   . --- Solid state physics. --- Condensed matter. --- Nanotechnology. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Measurement Science and Instrumentation. --- Solid State Physics. --- Condensed Matter Physics. --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids --- Physics --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Films, Thin --- Solid film --- Solid state electronics --- Surfaces (Technology) --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Analytical chemistry --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Molecular technology --- Nanoscale technology --- High technology --- Qualitative

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Almost 30 years after the first reports on surface-enhanced Raman signals, the phenomenon of surface-enhanced Raman scattering (SERS) is now well established. Yet, explaining the enhancement of a spectroscopic signal by fouteen orders of magnitude continues to attract the attention of physicists and chemists alike. And, at the same time and rapidly growing, SERS is becoming a very useful spectroscopic tool with exciting applications in many fields. SERS gained particular interest after single-molecule Raman spectroscopy had been demonstrated. This bookl summarizes and discusses present theoretical approaches that explain the phenomenon of SERS and reports on new and exciting experiments and applications of the fascinating spectroscopic effect.

Spectrum Analysis, Raman --- Raman effect, Surface enhanced --- Surfaces (Physics) --- Effet exalté de surface Raman --- Surfaces (Physique) --- Raman effect, Surface enhanced. --- Surfaces (Physics). --- Spectrum Analysis --- Scattering, Radiation --- Chemistry Techniques, Analytical --- Investigative Techniques --- Analytical, Diagnostic and Therapeutic Techniques and Equipment --- Light & Optics --- Physics --- Physical Sciences & Mathematics --- Enhanced Raman scattering --- Surface enhanced Raman effect --- Surface enhanced Raman scattering --- Physics. --- Atomic structure. --- Molecular structure. --- Spectra. --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Materials science. --- Materials --- Thin films. --- Optics, Lasers, Photonics, Optical Devices. --- Characterization and Evaluation of Materials. --- Surfaces and Interfaces, Thin Films. --- Atomic/Molecular Structure and Spectra. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Surfaces. --- Surface chemistry --- Surfaces (Technology) --- Lasers. --- Photonics. --- Materials—Surfaces. --- Atomic structure  . --- Molecular structure . --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Solids --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Films, Thin --- Solid film --- Solid state electronics --- Coatings --- Thick films --- Material science --- Physical sciences --- New optics --- Light amplification by stimulated emission of radiation --- Masers, Optical --- Optical masers --- Light amplifiers --- Light sources --- Optoelectronic devices --- Nonlinear optics --- Optical parametric oscillators --- Qualitative --- Analytical chemistry