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How to plan an audit
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ISBN: 0873890329 Year: 1987 Publisher: Milwaukee American society for quality control

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Quality control --- Auditing

The lean six sigma pocket toolbook : a quick reference guide to nearly 100 tools for improving process quality, speed, and complexity
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ISBN: 0071441190 9780071441193 Year: 2005 Publisher: New York (N.Y.) McGraw-Hill

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Bestselling Lean Six Sigma author Michael George provides the first pocket guide for deployers of Lean Six Sigma 'The Lean Six Sigma Pocket Toolbook 'blends Lean and Six Sigma tools and concepts, providing expert advice on how to determine which tool within a "family" is best for different purposes. Packed with detailed examples and step-bystep instructions, it's the ideal handy reference guide to help Green and Black Belts make the transition from the classroom to the field., Features brief summaries and examples of the 70 most important tools in Lean Six Sigma, such as "Pull," "Heijunka," and "Control Charts", Groups tools by purpose and usage, Offers a quick, easy reference on using the DMAIC improvement cycle, Provides comprehensive coverage in a compact, portable format

Lithography process control.
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ISBN: 0819430528 Year: 1999 Publisher: Bellingham SPIE

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Procurement quality control
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ISBN: 0873890035 Year: 1988 Publisher: Milwaukee American society for quality control

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Six Sigma for electronics design and manufacturing.
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ISBN: 0071395113 Year: 2002 Publisher: New York (N.Y.) McGraw-Hill

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Taguchi techniques for quality engineering : loss function, orthogonal experiments, parameter and tolerance design.
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ISBN: 0070538662 9780070538665 Year: 1988 Publisher: New York (N.Y.) MacGraw-Hill

What is total quality control? : The Japanese way
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ISBN: 0139524339 Year: 1985 Publisher: Englewood Cliffs (N.J.) Prentice Hall


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SPC and continuous improvement.
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ISBN: 3540504818 3662224216 3662224194 Year: 1989 Publisher: Kempston IFS publications

Quality is free : the art of making quality certain.
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ISBN: 0070145121 0451624688 9780070145122 Year: 1979 Publisher: New York (N.Y.) MacGraw-Hill

X-ray metrology in semiconductor manufacturing.
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ISBN: 0849339286 Year: 2006 Publisher: Boca Raton Taylor and Francis

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