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Hot carriers --- Nanostructures --- Semiconductors --- Congresses

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Integrated circuits --- Metal oxide semiconductors --- Hot carriers --- Very large scale integration --- Defects --- Mathematical models --- Reliability --- -Metal oxide semiconductors --- -Unipolar transistors --- Semiconductors --- Transistors --- Charge coupled devices --- Carriers, Hot --- Hot carrier conduction --- Hot electrons --- Electrons --- Holes (Electron deficiencies) --- -Mathematical models --- -Reliability --- Unipolar transistors --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Reliability&delete& --- Very large scale integration&delete& --- Defects&delete& --- Integrated circuits - Very large scale integration - Defects - Mathematical models --- Metal oxide semiconductors - Reliability - Mathematical models --- Hot carriers - Reliability - Mathematical models