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Surface analysis : the principal techniques
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ISBN: 0471959391 0471972924 9780471959397 9780471972921 Year: 1997 Publisher: Chichester [England] ; New York : John Wiley,

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Abstract

Vacuum Technology for Applied Surface Science (R Wilson) Electron Spectroscopy for Chemical Analysis (B Ratner & D Castner) Auger Electron Spectroscopy (H Mathieu) Secondary Ion Mass Spectroscopy-the Surface Mass Spectrometry (J Vickerman & A Swift) Low-Energy Ion Scattering and Rutherford Backscattering (E Taglauer) Vibrational Spectroscopy from Surfaces (M Pemble) Surface Structure Determination by Interference Techniques (W Flavell) Scanning Tunnelling Microscopy and Atomic Force Microscopy (G Leggett) Index.

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