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Book
Radiation Tolerant Electronics
Author:
ISBN: 303921280X 3039212796 Year: 2019 Publisher: MDPI - Multidisciplinary Digital Publishing Institute

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Abstract

Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.

Keywords

single event effects --- n/a --- radiation-hardening-by-design (RHBD) --- frequency divider by two --- single event upset --- Image processing --- CMOS analog integrated circuits --- FPGA --- total ionizing dose (TID) --- Impulse Sensitive Function --- soft error --- hardening by design --- radiation hardening by design --- X-rays --- Single-Event Upsets (SEUs) --- line buffer --- heavy ions --- VHDL --- FPGA-based digital controller --- radiation hardening by design (RHBD) --- radiation hardening --- SRAM-based FPGA --- proton irradiation --- ring oscillator --- sensor readout IC --- fault tolerance --- space application --- physical unclonable function --- voltage controlled oscillator (VCO) --- Ring Oscillators --- analog single-event transient (ASET) --- single event opset (SEU) --- SEB --- single event upsets --- bipolar transistor --- total ionizing dose --- protons --- triple modular redundancy (TMR) --- gain degradation --- space electronics --- saturation effect --- configuration memory --- Co-60 gamma radiation --- total ionization dose (TID) --- frequency synthesizers --- CMOS --- PLL --- TDC --- single-event upsets (SEUs) --- bandgap voltage reference (BGR) --- 4MR --- single-shot --- error rates --- Radiation Hardening by Design --- soft errors --- heavy-ions --- single-event effects (SEE) --- single event transient (SET) --- SEE testing --- proton irradiation effects --- RFIC --- single event upset (SEU) --- FMR --- ionization --- radiation tolerant --- triplex–duplex --- neutron irradiation effects --- digital integrated circuits --- single event gate rupture (SEGR) --- power MOSFETs --- ring-oscillator --- selective hardening --- voltage reference --- nuclear fusion --- TMR --- gamma-rays --- gamma ray --- instrumentation amplifier --- radiation effects --- reference circuits --- radiation-hardened --- triplex-duplex


Book
The Modifications of Metallic and Inorganic Materials by Using Energetic Ion/Electron Beams
Author:
Year: 2022 Publisher: Basel MDPI - Multidisciplinary Digital Publishing Institute

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Abstract

This book consists of original and review papers which describe basic and applied studies for the modifications of metallic and inorganic materials by using energetic ion/electron beams. When materials are irradiated with energetic charged particles (ions /electrons), their energies are transferred to electrons and atoms in materials, and the lattice structures of the materials are largely changed to metastable or non-thermal-equilibrium states, modifying several physical properties. Such phenomena will engage the interest of researchers as a basic science, and can also be used as promising tools for adding new functionalities to existing materials and for the development of novel materials. The papers in this book cover the ion/electron-beam-induced modifications of several properties (optical, electronic, magnetic, mechanical, and chemical properties) and lattice structures. This book will, therefore, be useful for many scientists and engineers who have been involved in fundamental material science and the industrial applications of metallic and inorganic materials.

Keywords

swift heavy ion --- YAG (Y3Al5O12) --- refractive index profiling --- synergy effect --- optical waveguide --- hillocks --- ion tracks --- ion irradiation --- TEM --- vanadium alloy --- irradiation hardening --- radiation damage --- electron irradiation --- metal surface --- sputtering --- groove --- hole --- self-organization --- pattern --- laser photocathode --- pulsed electron sources --- pulsed transmission electron microscope --- ion beam --- copper oxide --- chromatic change --- photoemission spectrum --- beam viewer --- light water reactor --- zirconium alloys --- nuclear fuel cladding --- thermal desorption spectroscopy --- transmission electron microscopy --- high energy irradiation --- ion track overlapping --- oxides --- Monte Carlo simulation for two-dimensional images --- lattice structures and magnetic states --- binomial and Poisson distribution functions --- ion accelerators at WERC --- irradiation effects on space electronics --- single event --- total ionization dose --- displacement damage --- solar cell --- space application --- irradiation test --- beam condition --- degradation --- standardization --- ISO --- high-Tc superconductors --- critical current density --- flux pinning --- heavy-ion irradiation --- columnar defects --- anisotropy --- superconductor --- irradiation --- critical current --- cerium oxide --- CeO2 --- swift heavy ions --- phase transition --- partially stabilized zirconia --- XRD --- radiation simulation --- ion-track etching --- electrodeposition --- micro/nano-sized metal cones --- template synthesis --- electrocatalyst --- excited reaction field --- transmission electron microscope --- nanomaterials --- manipulation --- nanostructure --- Al --- Al2O3 --- accelerator-driven system (ADS) --- liquid metal corrosion (LMC) --- lead–bismuth eutectic (LBE) --- self-ion irradiation --- oxygen concentration in LBE --- irradiation effect on corrosion behavior --- electronic excitation --- lattice disordering --- electron–lattice coupling --- nanopore structure --- ceria --- molecular dynamics --- simulation --- structural analysis --- defects --- n/a --- lead-bismuth eutectic (LBE) --- electron-lattice coupling

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