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This book illustrates a few exemplary scientific topics addressed through the use of two complementary x-ray scattering techniques: inelastic x-ray scattering and x-ray powder diffraction. These scattering methods are the focus of the two main sections of this book. These sections are subdivided into chapters discussing specific applications. The general aim of this volume is providing a concise overview of the opportunities disclosed by these two experimental methods, providing some guidance for scientists picking up this field and, hopefully, inspiring more mature scientists towards the achievement of new advances in this area.

X-ray crystallography. --- X-rays --- Diffraction.

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Imaging methods such as X-ray microscopy are used in non-destructive material analysis to achieve resolutions in the sub micrometer range. Imaging optics are required, for which X-ray lenses are particularly suitable for photon energies above 10 keV. To ensure the universal use of these lenses with constant optical properties over a wide photon energy range, for the first time an X-ray zoom lens was developed in this work.

Röntgenmikroskopie --- X-ray lens --- zoom lens --- X-ray microscopy --- transfocator --- Zoomlinse --- Transfokator --- X-ray optic --- Röntgenoptik --- Röntgenlinse

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The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

X-ray spectroscopy. --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- XES (X-ray emission spectroscopy) --- Spectrum analysis --- Laser physics

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X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.

X-ray spectroscopy. --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- XES (X-ray emission spectroscopy) --- Spectrum analysis --- Physical Sciences --- Engineering and Technology --- Optoelectronics --- Physics --- Optics and Lasers

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Grating based X-ray phase contrast imaging sets out to overcome the limits of conventional X-ray imaging in the detection of subtle density differences and opens a way to characterize a sample’s microstructure without the need for ultrahigh spatial resolution. The technique relies on grating structures with micrometric periods and extreme aspect ratio – their fabrication by X-ray lithography with optimal structure quality is the topic of this work.

Talbot effect --- Röntgengitter --- LIGA --- X-ray optics --- Phasenkontrast --- Talbot-Effect --- phase contrast --- X-ray gratings --- Röntgenoptik