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ISBN: 1504496558 9781504496551 Year: 2023 Publisher: New York : IEEE,
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ISBN: 1504496825 Year: 2023 Publisher: New York : IEEE,
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ISBN: 9798350343250 9798350343595 Year: 2023 Publisher: Piscataway : IEEE,
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Year: 1976 Publisher: Metals Park, Ohio : American Society for Metals,
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Metals --- Nondestructive testing --- Nondestructive testing. --- Testing --- Testing.
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ISSN: 07700725 Publisher: Brussel Nationaal Centrum voor Wetenschappelijk en Technisch Onderzoek der Cementnijverheid
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ISBN: 0738165131 Year: 2011 Publisher: [Place of publication not identified] : IEEE,
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The descriptions of the standard transient recovery voltage (TRV) envelopes and ratings are changed in this amendment. This is applicable for ac high-voltage circuit breakers rated above 1000 V and on a symmetrical current basis. The capability limits of these circuit breakers are determined to a major degree by the TRV. The revised descriptions of TRV bring the TRV requirements in IEEE standards into harmony with the TRV requirements in IEC standards that apply to the same type and class of equipment. The TRV revisions addressed in this amendment to IEEE Std C37.09-1999 are described in amendment IEEE Std C37.04b ́2008.
Periodical
ISSN: 00255394
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ISBN: 0387294082 1489987738 9786610460328 1280460326 0387294090 9780387294087 Year: 2006 Publisher: Dordrecht Springer
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Electronic circuits --- Testing. --- Testing
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ISBN: 1615038477 9781613447611 1613447612 9781615038329 1615038329 9781615038473 9780615038322 0615038328 1615038329 9781615038329 0615038328 1627083464 Year: 2011 Publisher: Materials Park, Ohio ASM International
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ISBN: 3035702780 9783035702781 9783035702187 3035702187 9783038357278 3038357278 3038357871 9783038357872 3038356581 9783038356585 Year: 2016 Publisher: Pfaffikon Trans Tech
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