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Year: 1970 Publisher: London New York, NY : Academic Press,
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ISBN: 146736018X 1467360171 1467360201 Year: 2013 Publisher: Piscataway, NJ : IEEE Press,
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ISBN: 1479947318 1479947296 147994730X Year: 2014 Publisher: Piscataway, NJ : IEEE,
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Aiming at strengthening academic communication and promoting the innovation development of nondestructive testing, the International Far East Forum on Nondestructive Evaluation Testing (FENDT) has become the most important event for Nondestructive Evaluation Testing in China since its inception in Nanjing, 2004 The forum assembles all the professionals such as leading researchers, engineers, scientists, industrial people and students worldwide under one roof every year It is a great platform for sharing experiences, innovative ideas, industrial progresses and research results in the field of Ultrasonic Evaluation Testing, Magnetic particle Testing, Radiographic Testing and Eddy current Testing etc The conference papers that reviewed by experts organized will be published and cited by IEEE The conference also provides a showcase platform for companies to exhibit their latest technology and products FENDT 2014 with an expected 600 participants is the ideal occasion to exhibit you.
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ISBN: 1665440821 166544083X Year: 2020 Publisher: Piscataway, NJ : IEEE,
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ISSN: 00385492 Year: 1992 Publisher: New York: Consultants bureau,
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ISBN: 0198517041 Year: 1969 Publisher: London : Oxford university press,
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Book
Year: 1958 Publisher: München : Oldenbourg,
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Book
ISBN: 0198591322 Year: 1975 Publisher: [London] : Oxford University Press for the Design Council, the British Standards Institution and the Council of Engineering Institutions,
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