Narrow your search

Library

ULiège (22)

ULB (13)

UCLouvain (11)

IMEC (9)

KU Leuven (9)

EhB (3)

Thomas More Kempen (3)

UCLL (3)

UGent (3)

VUB (3)

More...

Resource type

book (27)


Language

English (24)

French (3)


Year
From To Submit

2011 (1)

2010 (1)

2008 (1)

2006 (1)

2005 (1)

More...
Listing 1 - 10 of 27 << page
of 3
>>
Sort by
Layout minimization of CMOS cells
Authors: ---
ISBN: 0792391829 Year: 1992 Volume: SECS 160 Publisher: Boston : Kluwer Academic Publishers,


Book
Conception des ASICs
Authors: --- --- --- ---
ISBN: 222582102X Year: 1990 Publisher: Paris : Masson,

Wave pipelining : theory and CMOS implementation
Authors: --- ---
ISBN: 0792393988 Year: 1994 Publisher: Boston : Kluwer Academic Publishers,

Smart Power ICs : technologies and applications
Authors: --- --- ---
ISBN: 3540603328 Year: 1996 Publisher: Berlin : Springer,


Book
CMOS VLSI design : a circuits and systems perspective
Authors: ---
ISBN: 9780321547743 Year: 2011 Publisher: Boston : Addison Wesley,

Design automation for timing-driven layout synthesis
Authors: ---
ISBN: 0792392817 Year: 1993 Publisher: Boston : Kluwer Academic Publishers,

Leakage in nanometer CMOS technologies
Authors: ---
ISBN: 128061658X 9786610616589 0387281339 0387257373 9780387257372 9780387281339 Year: 2006 Publisher: New York, NY : [Great Britain] : Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumption, and in many scaled technologies leakage contributes 30-50% of the overall power consumption under nominal operating conditions. Leakage is important in a variety of different contexts. For example, in desktop applications, active leakage power (i.e., leakage power when the processor is computing) is becoming significant compared to switching power. In battery operated systems, standby leakage (i.e., leakage when the processor clock is turned off) dominates as energy is drawn over long idle periods. Increased transistor leakages not only impact the overall power consumed by a CMOS system, but also reduce the margins available for design due to the strong relationship between process variation and leakage power. It is essential for circuit and system designers to understand the components of leakage, sensitivity of leakage to different design parameters, and leakage mitigation techniques in nanometer technologies. This book provides an in-depth treatment of these issues for researchers and product designers.

Listing 1 - 10 of 27 << page
of 3
>>
Sort by