Search
Feedback
About UniCat 
Help
News
| Listing 1 - 10 of 347 | << page >> |
Sort by
|
Book
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Book
Year: 1964 Publisher: Paris: [éditeur inconnu],
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Book
ISBN: 3736987331 Year: 2018 Publisher: Göttingen : Cuvillier Verlag,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Book
ISBN: 3736984804 Year: 2017 Publisher: Gottingen, [Germany] : Cuvillier Verlag,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Book
Year: 1964 Publisher: Englewood Cliffs (N.J.) : Prentice-Hall,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Book
Year: 1964 Publisher: Englewood Cliffs, N.J. : Prentice-Hall,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
ISBN: 0201122960 Year: 1989 Publisher: Reading (Mass.) : Addison-Wesley,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Book
Year: 1962 Publisher: Princeton, NJ : ©1962 D. Van Nostrand Company,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Book
ISBN: 1504461193 Year: 2019 Publisher: New York, New York : IEEE,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.
Book
ISBN: 0081010893 1785481541 9780081010891 9781785481543 Year: 2021 Publisher: London : ISTE Press,
Abstract | Keywords | Export | Availability | Bookmark
Loading...Choose an application
- Reference Manager
- EndNote
- RefWorks (Direct export to RefWorks)
Diodes, Semiconductor --- Reliability. --- Crystal diodes --- Diodes, Crystal --- Semiconductor diodes --- Semiconductors
| Listing 1 - 10 of 347 | << page >> |
Sort by
|