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KU Leuven (3)

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book (7)

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2004 (1)

1994 (1)

1985 (1)

1982 (1)

1980 (1)
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Book

Probabilistic models for some intelligence and attainment tests
Authors: Rasch, Georg --- Wright, Benjamin D.
ISBN: 0226705544 Year: 1980 Publisher: Chicago (Ill.): University of Chicago press

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Ability --- Educational tests and measurements --- Intelligence tests --- Psychology --- Testing --- Mathematical models

Book

Best test design.
Authors: Wright, Benjamin D. --- Stone, Mark H.
Year: 1979 Publisher: Chicago (Ill.) : Mesa press,

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Book

Making measures
Authors: Wright, Benjamin D. --- Stone, Mark H.
ISBN: 0974987115 Year: 2004 Publisher: Chicago, Ill. Phaneron

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Measure theory. Mathematical integration --- Mathematical statistics

Book

Best test design
Authors: Wright, Benjamin D. --- Stone, Mark H.
Year: 1979 Publisher: Chicago Mesa press

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Book

Rating scale analysis
Authors: Masters, Geofferey N. --- Wright, Benjamin D.
ISBN: 0941938018 Year: 1982 Publisher: Chicago Mesa press

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Psychological tests

Book

Applications of probabilistic conjoint measurement
Authors: Wright, Benjamin D. --- Fisher, William P.
Year: 1994 Publisher: New York (N.Y.): Pergamon,

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Book

Bruce Choppin on measurement and education
Authors: MacArthur, David L. --- Wright, Benjamin D.
ISBN: 0080327559 9780080327556 Year: 1985 Publisher: Oxford: Pergamon,

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Choppin, Bruce

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