Union Catalogue of Belgian Libraries
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A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
Authors:
McCrackin, F. L.
---
United States.
Year: 1964
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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A Fortran program for analysis of ellipsometer measurements
Authors:
McCrackin, F. L.
---
United States.
Year: 1969
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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System of hardware and software developed for size exclusion chromatography

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Models for the migration of low molecular weight additives in polyolefins

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Models for the migration of paraffinic additives in polythylene

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Performance of plastic packaging for hazardous materials transportation : part IV. Standardizing permeation measurements

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An evaluation of existing models describing the migration of additives in polymers

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Models for the migration of additives in polyolefins

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Models for the migration of additives in polyolefins

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