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book (9)


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1987 (1)

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1978 (1)

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A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
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Year: 1964 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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A Fortran program for analysis of ellipsometer measurements
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Year: 1969 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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System of hardware and software developed for size exclusion chromatography
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Year: 1987 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Models for the migration of low molecular weight additives in polyolefins
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Year: 1981 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Models for the migration of paraffinic additives in polythylene
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Year: 1979 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Performance of plastic packaging for hazardous materials transportation : part IV. Standardizing permeation measurements
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Year: 1979 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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An evaluation of existing models describing the migration of additives in polymers
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Year: 1978 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Models for the migration of additives in polyolefins
Authors: --- --- --- --- --- et al.
Year: 1980 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Book
Models for the migration of additives in polyolefins
Authors: --- --- --- --- --- et al.
Year: 1979 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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