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In situ real time characterization of thin films : edited by Orlando Auciello, Alan R. Krauss.
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Authors:
Auciello, Orlando
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Krauss, Alan Robert
ISBN: 0471241415 Year: 2001 Publisher: New York (N.Y.) : Wiley,
ISBN: 0471241415 Year: 2001 Publisher: New York (N.Y.) : Wiley,
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