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Vizantijskie vesovye znaki : katalog kollekcii
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ISBN: 9785935728120 5935728125 Year: 2018 Publisher: Sankt-Peterburg: Izdatel'stvo Gosudarstvennogo Èrmitaža,

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Scale & the Incas
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ISBN: 9780691172736 Year: 2018 Publisher: Princeton Oxford Princeton University Press

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A groundbreaking work on how the topic of scale provides an entirely new understanding of Inca material culture Although questions of form and style are fundamental to art history, the issue of scale has been surprisingly neglected. Yet, scale and scaled relationships are essential to the visual cultures of many societies from around the world, especially in the Andes. In Scale and the Incas, Andrew Hamilton presents a groundbreaking theoretical framework for analyzing scale, and then applies this approach to Inca art, architecture, and belief systems. The Incas were one of humanity’s great civilizations, but their lack of a written language has prevented widespread appreciation of their sophisticated intellectual tradition. Expansive in scope, this book examines many famous works of Inca art including Machu Picchu and the Dumbarton Oaks tunic, more enigmatic artifacts like the Sayhuite Stone and Capacocha offerings, and a range of relatively unknown objects in diverse media including fiber, wood, feathers, stone, and metalwork. Ultimately, Hamilton demonstrates how the Incas used scale as an effective mode of expression in their vast multilingual and multiethnic empire. Lavishly illustrated with stunning color plates created by the author, the book’s pages depict artifacts alongside scale markers and silhouettes of hands and bodies, allowing readers to gauge scale in multiple ways. The pioneering visual and theoretical arguments of Scale and the Incas not only rewrite understandings of Inca art, but also provide a benchmark for future studies of scale in art from other cultures.


Book
Metrology
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ISBN: 1789235944 1789235952 1838815171 Year: 2018 Publisher: IntechOpen

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Metrology, the science of measurement, is crucial for many sciences and technological developments. Since metrology helps to improve many other sciences, the book reflects in general metrology and some special metrological approaches at different fields such as radiation and frequency measurements in detail. This book also focuses on technical testing and control applications in the industry. It also intends the fundamentals of metrology concerning the related standards and systems of units. In addition, the book considers the calibration of measurement instruments and measurement uncertainties as the basic requirements of the related quality standards.


Periodical
Nanomanufacturing and metrology.
ISSN: 25208128 2520811X Year: 2018 Publisher: [Singapore] : Springer Singapore,

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Pierre Keller : le Kilo-Art
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ISBN: 9783037645444 Year: 2018 Publisher: Zurich JRP|Ringier

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Truth and traceability in physics and metrology
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ISBN: 1643270974 1643270966 9781643270975 9781643270968 Year: 2018 Publisher: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : Morgan & Claypool Publishers, IOP Publishing,

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Metrological data is known to be blurred by the imperfections of the measuring process. In retrospect, for about two centuries regular or constant errors were no focal point of experimental activities, only irregular or random error were. Today's notation of unknown systematic errors is in line with this. Confusingly enough, the worldwide practised approach to belatedly admit those unknown systematic errors amount to considering them as being random, too. This book discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors will be treated as what they physically are--namely as constants being unknown with respect to magnitude and sign. The ideas considered in this book issue a proceeding steadily localizing the true values of the measurands and consequently traceability.


Book
Metric culture
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ISBN: 1787439488 1787432890 1787432904 1787544583 9781787432895 9781787439481 9781787432901 Year: 2018 Publisher: United Kingdom

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We live in a “metric culture” where data, algorithms, and numbers play an unmistakably powerful role in defining, shaping and ruling the world we inhabit. Increasingly, governments across the globe are turning towards metric technologies to find solutions for managing various social domains such as healthcare and education. While private corporations are becoming more and more interested in the collection and analysis of data and metrics for profit generation and service optimisation. What is striking about this metric culture is that not only are governments and private companies the only actors interested in using metrics and data to control and manage individuals and populations, but individuals themselves are now choosing to voluntarily quantify themselves and their lives more than ever before, happily sharing the resulting data with others and actively turning themselves into projects of (self-) governance and surveillance.'Metric Culture' is also not only about data and numbers alone but links to issues of power and control, to questions of value and agency, and to expressions of self and identity. This book provides a critical investigation into these issues examining what is driving the agenda of metric culture and how it is manifested in the different spheres of everyday life through self-tracking practices. Authors engage with a broad range of topics, examples, geographical contexts, and sites of analysis in order to account for the diversity and hybridity of metric culture and explore its various social, political and ethical implications.


Book
2018 IEEE International Workshop on Metrology for Industry 4.0 and IoT : proceedings : Brescia, Italy, April 16-18, 2018
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ISBN: 1538624974 1538624982 Year: 2018 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,


Book
Quantum metrology with photoelectrons.
Authors: --- ---
ISBN: 1681749998 1681746840 9781681749990 9781681746845 Year: 2018 Publisher: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : Morgan & Claypool Publishers, IOP Publishing,

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Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.


Book
Quantum metrology with photoelectrons.
Authors: --- ---
ISBN: 1681746883 9781681746883 Year: 2018 Publisher: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : Morgan & Claypool Publishers, IOP Publishing,

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Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

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