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book (30)

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2013 (30)

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Book
Biometrics and Security Technologies (ISBAST), 2013 International Symposium on
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ISBN: 076955010X 1467353132 1467353140 9781467353144 Year: 2013 Publisher: [Place of publication not identified] : Institute of Electrical and Electronics Engineers,

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Book
2013 Second International Conference on Agro-Geoinformatics (Agro-Geoinformatics)
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ISBN: 1479908681 1479908673 Year: 2013 Publisher: Piscataway, N.J. : IEEE,

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Book
2013 IEEE Sixth International Conference on Biometrics : Theory, Applications and Systems (BTAS)
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ISBN: 1479905275 1479905267 Year: 2013 Publisher: Piscataway, N.J. : IEEE,

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Book
2013 International Conference of the BIOSIG Special Interest Group (BIOSIG)
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ISBN: 3885796066 1467361127 Year: 2013 Publisher: Piscataway, New Jersey : IEEE,

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Book
2013 Ninth International Conference on Intelligent Information Hiding and Multimedia Signal Processing
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ISBN: 1479913707 0769551203 9780769551203 9781479913701 Year: 2013 Publisher: Los Alamitos, Calif. : IEEE,

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Book
2013 IEEE Symposium on Computational Intelligence in Biometrics and Identity Management (CIBIM)
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ISBN: 1467358797 1467358789 Year: 2013 Publisher: Piscataway, New Jersey : IEEE,

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Book
2013 International Conference on Biometrics (ICB)
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ISBN: 1479903108 1479903116 Year: 2013 Publisher: Piscataway, New Jersey : IEEE,

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Book
Writing guidelines to develop a memorandum of understanding for interoperable automated fingerprint identification systems
Authors: --- --- --- --- --- et al.
Year: 2013 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Book
The current and future applications of biometric technologies : joint hearing before the Subcommittee on Research & Subcommittee on Technology, Committee on Science, Space, and Technology, House of Representatives, One Hundred Thirteenth Congress, first session, Tuesday, May 21, 2013.
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Year: 2013 Publisher: Washington : U.S. Government Printing Office,

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Book
Fingerprint scanner affordances
Authors: --- --- --- --- --- et al.
Year: 2013 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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