Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.

Reflectometer --- Thin films --- Materials --- Surfaces (Technology) --- Ellipsometry --- Optical properties --- Ellipsometry. --- Reflectometer. --- Optical properties. --- Surfaces (Technology). --- Thin films - Optical properties --- Materials - Optical properties

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Ellipsometry --- Polarization (Light) --- 535 --- 535 Optics --- Optics --- Rotation of the plane of polarization --- Electromagnetic waves --- Wave-motion, Theory of --- Optical rotation --- Stereochemistry --- Polarimetry --- Surfaces (Technology) --- Thin films --- Polarization --- Ellipsometry. --- Polarization (Light). --- Ellipsometers --- Light visible radiation --- Optical measuring instruments --- Optical reflectometers --- Polarized electromagnetic radiation --- Polarizers

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Ellipsometry --- Spectrum analysis --- Materials --- Optical properties --- Ellipsométrie --- Ellipsométrie --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Engineering --- Engineering materials --- Industrial materials --- Engineering design --- Manufacturing processes --- Polarimetry --- Polarization (Light) --- Surfaces (Technology) --- Thin films --- Qualitative --- Analyse spectrale --- Spectrometry --- Analytical chemistry --- Materials - Optical properties