Narrow your search

Library

ULB (2)

KU Leuven (1)

LUCA School of Arts (1)

Odisee (1)

Thomas More Kempen (1)

Thomas More Mechelen (1)

UCLL (1)

UGent (1)

ULiège (1)

Vlerick Business School (1)

More...

Resource type

book (2)


Language

English (2)


Year
From To Submit

2003 (1)

2002 (1)

Listing 1 - 2 of 2
Sort by

Book
Demystifying mixed-signal test methods
Author:
ISBN: 1281006734 9786611006730 0080491065 0750676167 9780750676168 9780080491066 9781281006738 6611006737 Year: 2003 Publisher: Amsterdam ; Boston : Newnes,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Mixed Signal Test Methods Demystified is a less theoretical, less mathematical, and more applications-oriented approach than other books available on the topic. In effect, this book will give readers a ""just in time"" understanding of the essentials of mixed signal testing techniques. Emphasis will be on commonly used devices and systems (such as PLLs and DSP) that engineers encounter in their daily tasks. Sampling theory is covered in detail, as this is the foundation for understanding all mixed signal testing technique, and readers will have a strong intuitive grasp of this topic after fini

A designer's guide to built-in self-test
Author:
ISBN: 1280208260 9786610208265 0306475049 1402070500 Year: 2002 Publisher: Boston : Kluwer Academic Publishers,

Loading...
Export citation

Choose an application

Bookmark

Abstract

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.

Listing 1 - 2 of 2
Sort by