Narrow your search

Library

UCLouvain (5)

KU Leuven (3)

UGent (3)

UNamur (3)

ULiège (2)

LUCA School of Arts (1)

Odisee (1)

Thomas More Kempen (1)

Thomas More Mechelen (1)

UCLL (1)

More...

Resource type

book (5)


Language

English (5)


Year
From To Submit

2005 (1)

1999 (2)

1988 (1)

1977 (1)

Listing 1 - 5 of 5
Sort by
Ellipsometry for industrial applications
Author:
ISBN: 9783211820407 321182040X 9780387820408 038782040X Year: 1988 Publisher: Wien: Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

Keywords

Thin films --- Ellipsometry

Spectroscopic ellipsometry and reflectometry : a user's guide
Authors: ---
ISBN: 0471181722 9780471181729 Year: 1999 Publisher: New York (N.Y.): Wiley,

Loading...
Export citation

Choose an application

Bookmark

Abstract

While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.


Book
Ellipsometry and polarized light
Authors: ---
ISBN: 0720406943 9780720406948 Year: 1977 Publisher: Amsterdam: North-Holland,

Handbook of ellipsometry
Authors: ---
ISBN: 0815514999 0080947069 9786612002632 1282002635 0815517475 9786612002625 1591248493 1591242126 9781591242123 9780815517474 9780815517481 0815517483 9780815513650 0815513658 9780815514992 3540222936 9783540222934 9781591248491 9780815517467 0815517467 9786612002649 1282769227 9786612769221 0080946070 1282002643 Year: 2005 Publisher: Norwich, NY : Heidelberg, Germany : William Andrew Pub. ; Springer,

Loading...
Export citation

Choose an application

Bookmark

Abstract

The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale. With the


Book
Workshop on ISO polarisation observations, ISO data centre, Villafranca, Spain, 25-28 May 1999
Author:
ISBN: 9290927402 9789290927402 Year: 1999 Volume: 435 Publisher: Noordwijk: ESA,

Listing 1 - 5 of 5
Sort by