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ISBN: 0738197823 Year: 2015 Publisher: [Place of publication not identified] : IEEE,
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General considerations are presented for the electrical protection of telecommunications facilities serving electric supply locations. This standard contains material that is common to the IEEE 487 TM family of standards (i.e., dot-series) including fundamental protection theory; basic electrical protection philosophy, concepts, and designs; protection apparatus; service types; reliability; service performance objective (SPO) classifications; and transmission considerations. In general, special protective measures, handling procedures, and administrative procedures are necessary to provide electrical protection against damage to telecommunications facilities and equipment, maintain reliability of service, and ensure the safety of personnel.
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ISBN: 073813256X Year: 2002 Publisher: New York : IEEE,
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Two types of design tests for relays and relay systems that relate to the immunity of this equipment to repetitive electrical transients are specified. Test generator characteristics, test waveforms, selection of equipment terminals on which tests are to be conducted, test procedures, criteria for acceptance, and documentation of test results are described. This standard has been harmonized with IEC standards where consensus could be reached.
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ISBN: 0738173053 Year: 2012 Publisher: New York : IEEE,
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Two types of design tests for relays and relay systems that relate to the immunity of this equipment to repetitive electrical transients are specified. Test generator characteristics, test waveforms, selection of equipment terminals on which tests are to be conducted, test procedures, criteria for acceptance and documentation of test results are described. This standard has been harmonized with IEC standards where consensus could be reached. Keywords: fast transient test, IEEE C37.90.1, oscillatory test, relay, relay systems, surge withstand capability, SWC.
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ISBN: 1504440560 Year: 2018 Publisher: New York : IEEE,
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Surge protective components (SPCs) used in power and telecom surge protective devices (SPDs) and equipment ports are covered in the IEEE C62.42(TM) guide series. This part, Part 3 of the series, describes silicon PN-Junction clamping diode SPCs and covers technology variants, including forward biased semiconductor diodes, Zener breakdown semiconductor diodes, avalanche breakdown semiconductor diodes, punch-through semiconductor bipolar junction transistor diodes, and fold-back semiconductor bidirectional transistor diodes, as well as component construction; characteristics; ratings; and application examples.
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ISBN: 1559375205 0738109215 Year: 1995 Publisher: [Place of publication not identified] IEEE
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ISBN: 0738133930 0738133949 Year: 2003 Publisher: New York : IEEE,
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The scope of this recommended practice is to characterize the surge environment at locations on AC power circuits described in IEEE Std C62.41.1/sup TM/2002 by means of standardized waveforms and other stress parameters. The surges considered in this recommended practice do not exceed one half-cycle of the normal mains waveform (fundamental frequency) in duration. They can be periodic or random events and can appear in any combination of line, neutral, or grounding conductors. They include surges with amplitudes, durations, or rates of change sufficient to cause equipment damage or operational upset. While surge protective devices (SPDs) acting primarily on the amplitude of the voltage or current are often applied to divert the damaging surges, the upsetting surges might require other remedies.
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ISBN: 1504455568 Year: 2019 Publisher: [Place of publication not identified] : IEEE,
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ISBN: 1504454359 Year: 2019 Publisher: [Place of publication not identified] : IEEE,
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ISBN: 1504459563 Year: 2019 Publisher: [Place of publication not identified] : IEEE,
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ISBN: 1504459423 Year: 2019 Publisher: [Place of publication not identified] : IEEE,
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