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Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV
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ISBN: 1000043064 3731502631 Year: 2014 Publisher: KIT Scientific Publishing

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Abstract

In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm


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Entwicklung einer Röntgenzoomlinse
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ISBN: 1000089715 3731508850 Year: 2019 Publisher: KIT Scientific Publishing

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Abstract

Imaging methods such as X-ray microscopy are used in non-destructive material analysis to achieve resolutions in the sub micrometer range. Imaging optics are required, for which X-ray lenses are particularly suitable for photon energies above 10 keV. To ensure the universal use of these lenses with constant optical properties over a wide photon energy range, for the first time an X-ray zoom lens was developed in this work.


Book
X-ray microscopy
Authors: ---
Year: 1960 Publisher: Cambridge, : University Press,

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