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Pattern classifiers and trainable machines.
Authors: ---
ISBN: 0387904352 1461258405 1461258383 9780387904351 Year: 1981 Publisher: New York (N.Y.) : Springer,

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Dissertation
Aspects industriels des techniques de reconnaissance de formes
Authors: ---
Year: 1986 Publisher: Liège : Université de Liège, Faculté des sciences appliquées (ULg),

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Frontiers of pattern recognition : the proceedings of the international conference on frontiers of pattern recognition held at Honolulu, January 18-20, 1971
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ISBN: 0127371400 1322560447 1483268942 9780127371405 Year: 1972 Publisher: New York : Academic Press,

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Book
2007 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
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ISBN: 1424411793 1509090681 Year: 2007 Publisher: [Place of publication not identified] IEEE

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Linear and affine subspaces are commonly used to describe appearance of objects under different lighting, viewpoint, articulation, and identity. A natural problem arising from their use is - given a query image portion represented as a point in some high dimensional space - find a subspace near to the query. This paper presents an efficient solution to the approximate nearest subspace problem for both linear and affine subspaces. Our method is based on a simple reduction to the problem of nearest point search, and can thus employ tree based search or locality sensitive hashing to find a near subspace. Further speedup may be achieved by using random projections to lower the dimensionality of the problem. We provide theoretical proofs of correctness and error bounds of our construction and demonstrate its capabilities on synthetic and real data. Our experiments demonstrate that an approximate nearest subspace can be located significantly faster than the exact nearest subspace, while at the same time it can find better matches compared to a similar search on points, in the presence of variations due to viewpoint, lighting etc.


Book
2013 International Conference on Pattern Recognition, Informatics and Mobile Engineering (PRIME)
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ISBN: 1467358452 1467358436 Year: 2013 Publisher: [Place of publication not identified] IEEE

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Book
2013 2nd IAPR Asian Conference on Pattern Recognition (ACPR)
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ISBN: 1479921904 1479921912 Year: 2013 Publisher: Piscataway, NJ : IEEE,

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Topics of interest include all aspects of pattern recognition including, but not limited to A Computer Vision and Robot Vision B Pattern Recognition and Machine Learning C Signal Processing (signal, speech, image) D Media Processing and Interaction (video, document, medical applications, biometrics, HCI, VR).


Book
IEEE Std 660-1986 : IEEE Standard for Semiconductor Memory Test Pattern Language
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ISBN: 1504404122 Year: 1986 Publisher: [Place of publication not identified] : IEEE,

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The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the functional testing of memory devices. The language is intended to be used as a general descriptive language rather than one for programming a tester. As a result, the grammar and syntax are defined in a looser and more general way than would be required for a programming language.


Book
2014 22nd International Conference on Pattern Recognition : 24-28 August 2014, Stockholm, Sweden
Authors: ---
ISBN: 1479952109 1479952095 Year: 2014 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,

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Book
Advances in Pattern Recognition (ICAPR), 2015 Eighth International Conference on
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ISBN: 1479974595 1479974587 Year: 2015 Publisher: Piscataway, N.J. : IEEE,

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Book
10th International Conference on Pattern Recognition Systems (ICPRS-2019)
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ISBN: 1839531088 Year: 2019 Publisher: Piscataway, New Jersey : Institution of Engineering and Technology (IET),

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