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This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems.  It provides a holistic discussion of temperature management, including physical phenomena (reversal of the MOSFET temperature dependence) that have recently become problematic, along with circuit techniques for detecting, controlling, and adapting to these phenomena. A detailed discussion is also included of the general aspects of thermal-aware system design and management of temperature-induced faults. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability.  A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time. Provides background on aspects of nanoscale circuits and systems that are affected by temperature, how they are affected by temperature, and what systems can be used to reduce these effects; Describes chip implementation details of a new type of temperature sensor that can ensure reliable operation across multiple temperature dependences; Includes new methods for achieving temperature insensitivity with example circuits and fabrication-related details such as process variation management.              .

Adaptive control systems. --- Nanoelectromechanical systems. --- Temperature control. --- Temperature control --- Adaptive control systems --- Nanoelectromechanical systems --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Mechanical Engineering --- Technology - General --- Mechanical Engineering - General --- Electrical Engineering --- Control of temperature --- Temperature --- Nano-electro-mechanical systems --- Nanoelectromechanical devices --- Nanomechanical devices --- Nanomechanical machines --- Nanomechanical systems --- Nanometer scale devices --- Nanoscale devices --- Nanoscale electronic devices --- Nanostructured devices --- NEMS (Nanotechnology) --- Control --- Engineering. --- Nanotechnology. --- Electronics. --- Microelectronics. --- Electronic circuits. --- Circuits and Systems. --- Electronics and Microelectronics, Instrumentation. --- Nanotechnology and Microengineering. --- Automatic control --- Nanoelectronics --- Nanostructures --- Electromechanical devices

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This book addresses reliability and energy efficiency of on-chip networks using a configurable error control coding (ECC) scheme for datalink-layer transient error management. The method can adjust both error detection and correction strengths at runtime by varying the number of redundant wires for parity-check bits. Methods are also presented to tackle joint transient and permanent error correction, exploiting the redundant resources already available on-chip. A parallel and flexible network simulator is also introduced, which facilitates examining the impact of various error control methods on network-on-chip performance. Includes a complete survey of error control methods for reliable networks-on-chip, evaluated for reliability, energy and performance metrics; Provides analysis of error control in various network-on-chip layers, as well as presentation of an innovative multi-layer error control coding technique; Presents state-of-the-art solutions to address simultaneously reliability, energy and performance; Describes configurable error management solutions and their hardware implementation details for variable noise conditions; Provides details of a flexible and parallel NoC simulator and corresponding simulation setup to achieve the reported results.    .

Error-correcting codes (Information theory). --- Fault tolerance (Engineering). --- Networks on a chip -- Design and construction. --- Networks on a chip --- Error-correcting codes (Information theory) --- Fault tolerance (Engineering) --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Telecommunications --- Design and construction --- Design and construction. --- Fault tolerant design --- Fault withstandability (Engineering) --- Codes, Error-correcting (Information theory) --- Error-detecting codes (Information theory) --- Forbidden-combination check (Information theory) --- Self-checking codes (Information theory) --- Network on chip technology --- NoC technology --- Engineering. --- Nanotechnology. --- Electronics. --- Microelectronics. --- Electronic circuits. --- Circuits and Systems. --- Electronics and Microelectronics, Instrumentation. --- Nanotechnology and Microengineering. --- Artificial intelligence --- Automatic control --- Coding theory --- Information theory --- Embedded computer systems --- Reliability (Engineering)

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Chemical structure --- Electronics --- Electrical engineering --- Biotechnology --- nanotechniek --- biotechnologie --- elektronica --- elektrische circuits

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As technology scales into nanoscale regime, it is impossible to guarantee the perfect hardware design. Moreover, if the requirement of 100% correctness in hardware can be relaxed, the cost of manufacturing, verification, and testing will be significantly reduced. Many approaches have been proposed to address the reliability problem of on-chip communications. This book focuses on the use of error control codes (ECCs) to improve on-chip interconnect reliability. Coverage includes detailed description of key issues in NOC error control faced by circuit and system designers, as well as practical error control techniques to minimize the impact of these errors on system performance. Provides a detailed background on the state of error control methods for on-chip interconnects; Describes the use of more complex concatenated codes such as Hamming Product Codes with Type-II HARQ, while emphasizing integration techniques for on-chip interconnect links; Examines energy-efficient techniques for integrating multiple error control methods in on-chip interconnects; Introduces various design techniques to tradeoff the reliability and energy consumption of on-chip interconnects, including implementation of low link swing voltage and dynamic voltage scaling with error control codes, combination of Hamming product codes with type-II hybrid ARQ, and configurable error control codes implementation.  

Electrical engineering --- Programming --- Artificial intelligence. Robotics. Simulation. Graphics --- KI (kunstmatige intelligentie) --- CAD (computer aided design) --- elektrische circuits

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This book addresses reliability and energy efficiency of on-chip networks using a configurable error control coding (ECC) scheme for datalink-layer transient error management. The method can adjust both error detection and correction strengths at runtime by varying the number of redundant wires for parity-check bits. Methods are also presented to tackle joint transient and permanent error correction, exploiting the redundant resources already available on-chip. A parallel and flexible network simulator is also introduced, which facilitates examining the impact of various error control methods on network-on-chip performance. Includes a complete survey of error control methods for reliable networks-on-chip, evaluated for reliability, energy and performance metrics; Provides analysis of error control in various network-on-chip layers, as well as presentation of an innovative multi-layer error control coding technique; Presents state-of-the-art solutions to address simultaneously reliability, energy and performance; Describes configurable error management solutions and their hardware implementation details for variable noise conditions; Provides details of a flexible and parallel NoC simulator and corresponding simulation setup to achieve the reported results.    

Chemical structure --- Electronics --- Electrical engineering --- Biotechnology --- nanotechniek --- biotechnologie --- elektronica --- elektrische circuits