TY - BOOK ID - 9575541 TI - 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits AU - IEEE Staff AU - Institute of Electrical and Electronics Engineers Staff PY - 2011 SN - 1457701596 1457701588 9781457701580 PB - [Place of publication not identified] IEEE DB - UniCat KW - Integrated circuits KW - Testing UR - https://www.unicat.be/uniCat?func=search&query=sysid:9575541 AB - ER -