TY - BOOK ID - 8428501 TI - Internal photoemission spectroscopy : fundamentals and recent advances PY - 2014 SN - 0080999301 0080999298 1306470285 9781306470285 9780080999302 9780080999296 PB - London, England ; Waltham, Massachusetts : Elsevier Ltd, DB - UniCat KW - Photoelectron spectroscopy. KW - Photoemission. KW - Semiconductors -- Junctions. KW - Photoelectron spectroscopy KW - Photoemission KW - Semiconductors KW - Chemistry KW - Physics KW - Physical Sciences & Mathematics KW - Analytical Chemistry KW - Light & Optics KW - Junctions KW - Junctions. KW - Emission, Photoelectric KW - External photoelectric effect KW - Photoelectric effect, External KW - Photoelectric emission KW - Electrons KW - Photoelectricity KW - Junctions, Semiconductor KW - Semiconductor interface KW - Semiconductor interfaces KW - Semiconductor junctions KW - Interfaces (Physical sciences) KW - Spectroscopy, Photoelectron KW - Electron spectroscopy KW - Molecular orbitals KW - Molecular spectra KW - Molecular spectroscopy KW - Spectrum analysis KW - Emission KW - Interfaces UR - https://www.unicat.be/uniCat?func=search&query=sysid:8428501 AB - The second edition of Internal Photoemission Spectroscopy thoroughly updates this vital, practical guide to internal photoemission (IPE) phenomena and measurements. The book's discussion of fundamental physical and technical aspects of IPE spectroscopic applications is supplemented by an extended overview of recent experimental results in swiftly advancing research fields. These include the development of insulating materials for advanced SiMOS technology, metal gate materials, development of heterostructures based on high-mobility semiconductors, and more. Recent results concerning ER -